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Wide Field-of-View Reflection-Mode Ptychographic Imaging Microscope with Tabletop 12.7 nm High Harmonic Illumination

Published online by Cambridge University Press:  04 August 2017

Michael Tanksalvala
Affiliation:
JILA, University of Colorado, BoulderUSA.
Christina L. Porter
Affiliation:
JILA, University of Colorado, BoulderUSA.
Michael Gerrity
Affiliation:
JILA, University of Colorado, BoulderUSA.
Galen P. Miley
Affiliation:
Dept. of Chemistry, Northwestern University, EvanstonUSA.
Xiaoshi Zhang
Affiliation:
Kapteyn-Murnane Laboratories, BoulderUSA.
Charles S. Bevis
Affiliation:
JILA, University of Colorado, BoulderUSA.
Elisabeth R. Shanblatt
Affiliation:
JILA, University of Colorado, BoulderUSA.
Robert Karl Jr.
Affiliation:
JILA, University of Colorado, BoulderUSA.
Giulia F. Mancini
Affiliation:
JILA, University of Colorado, BoulderUSA.
Daniel A. Adams
Affiliation:
JILA, University of Colorado, BoulderUSA.
Henry C. Kapteyn
Affiliation:
JILA, University of Colorado, BoulderUSA. Kapteyn-Murnane Laboratories, BoulderUSA.
Margaret M. Murnane
Affiliation:
JILA, University of Colorado, BoulderUSA. Kapteyn-Murnane Laboratories, BoulderUSA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

Footnotes

These authors contributed equally to this work.

References

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[2] Zhang, B., et al, Ultramicroscopy 158 2015). pp. 98104.Google Scholar
[3] Fienup, J. R. Appl. Opt. 52 2013). pp. 4556.Google Scholar
[4] Maiden, A. M. & Rodenburg, J. M. Ultramicroscopy 109 2009). pp. 12561262.CrossRefGoogle Scholar
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[6] The authors acknowledge major support from the following grants: DARPA PULSE W31P4Q-13-1-0015, a Gordon and Betty Moore Foundation EPiQS Initiative through Grant GBMF4538, an NSF Science and Technology Center DMR- 1548924, and DOE STTR Grant No. DE-SC0006514.Google Scholar