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Progress in a New Method of Thickness Measurement by X-ray Analysis in TEM

Published online by Cambridge University Press:  04 August 2017

J. Sagar ,
P. Statham ,
J. Holland ,
P. Pinard  and
S. Lozano-Perez
J. Sagar
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
P. Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
J. Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
P. Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
S. Lozano-Perez
Affiliation:
University of Oxford, Department of Materials, Oxford, U.K.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 30 - 31
Copyright
© Microscopy Society of America 2017 

References

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