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Advances in Serial-Section Broad-Ion-Beam Tomography

Published online by Cambridge University Press:  04 August 2017

T. Hosman ,
S. Coyle ,
M. Hassel-Shearer ,
J.A. Hunt ,
A. Gholinia  and
P. Withers
T. Hosman
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
S. Coyle
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
M. Hassel-Shearer
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
J.A. Hunt
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
A. Gholinia
Affiliation:
School of Materials, University of Manchester, Manchester, M1 7HS, UK
P. Withers
Affiliation:
School of Materials, University of Manchester, Manchester, M1 7HS, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 16 - 17
Copyright
© Microscopy Society of America 2017 

References

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[1] Hosman, T., et al., Microsc. Microanal. 22(3 2016 p590–1.CrossRefGoogle Scholar
[2] Winiarski, , et al., Ultramicroscopy 172 2017 p52–64.CrossRefGoogle Scholar
[3] Hatch, JE editor Aluminum: properties and physical metallurgy. ASM International 1984 p64.Google Scholar