Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T08:37:26.080Z Has data issue: false hasContentIssue false
  • English
  • Français

Advances in Serial-Section Broad-Ion-Beam Tomography

Published online by Cambridge University Press:  04 August 2017

T. Hosman ,
S. Coyle ,
M. Hassel-Shearer ,
J.A. Hunt ,
A. Gholinia  and
P. Withers
T. Hosman
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
S. Coyle
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
M. Hassel-Shearer
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
J.A. Hunt
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
A. Gholinia
Affiliation:
School of Materials, University of Manchester, Manchester, M1 7HS, UK
P. Withers
Affiliation:
School of Materials, University of Manchester, Manchester, M1 7HS, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 16 - 17
Copyright
© Microscopy Society of America 2017 

References

■

[1] Hosman, T., et al., Microsc. Microanal. 22(3 2016 p590–1.CrossRefGoogle Scholar
[2] Winiarski, , et al., Ultramicroscopy 172 2017 p52–64.CrossRefGoogle Scholar
[3] Hatch, JE editor Aluminum: properties and physical metallurgy. ASM International 1984 p64.Google Scholar