Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-22T19:21:07.386Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative In-Situ AFM & SEM & EDX Analysis of Nanostructured Materials

Published online by Cambridge University Press:  04 August 2017

M. Winhold ,
M. Leitner ,
A. Lieb ,
P. Frederix ,
F. Hofbauer ,
T. Strunz ,
J. Sattelkov ,
H. Plank  and
C.H. Schwalb
M. Winhold
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
M. Leitner
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
A. Lieb
Affiliation:
Nanosurf AG, Liestal, Switzerland.
P. Frederix
Affiliation:
Nanosurf AG, Liestal, Switzerland.
F. Hofbauer
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
T. Strunz
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
C.H. Schwalb
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 26 - 27
Copyright
© Microscopy Society of America 2017 

References

[1] Dukic, M, Adams, JD & Fantner, GE Scientific Reports 5 (2015) 16393.CrossRefGoogle Scholar
[2] Matsumae, T, Koehler, AD, Suga, T & Hobart, KD Journal of the Electromechanical Society 163(6), E159–E161, 2016.CrossRefGoogle Scholar