Hydrothermal treatment of aqueous mixtures of sodium hydroxide, copper chloride and excess sodium silicate (Si/Cu ≥ 2) at 150 °C produced blue powders. Scanning electron microscopy/energy dispersive X-ray (SEM/EDX) analysis of the products show they all had similar chemical compositions, with Si/Cu ratios of approximately 1.33, the value expected for 2:1 trioctahedral phyllosilicates. Their X-ray diffraction (XRD) patterns were consistent with that of swelling smectite-type clays. Reaction mixtures that did not contain excess Si (Si/Cu ≤ 1.33) did not produce smectites. They gave gray mixtures of amorphous silicates and copper oxides, with some phyllosilicates. A mixture containing a Si/Cu ratio of 5.2 heated at 250 °C under 500 psi of Ar gave a pale blue solid containing a Si/Cu ratio of approximately 1, the value expected for chrysocolla. Transmission electron microscopy (TEM) showed this product had a well-ordered layered structure. Its XRD powder pattern was consistent with that of chrysocolla. This clay did not swell very much on exposure to glycol vapors. Peaks were observed in the cyclic voltam-mogram of electrodes modified with films of these synthetic Cu-clays. They were attributed to electrochemical activity of Cu(II) centers in the lattice of the clays. The presence of these redox active Cu(II) sites greatly improved charge transport in the films. Much larger voltametric waves were observed for [Os(bpy)3]2+ ions (“bpy” = the ligand 2,2′bipyridyl) adsorbed in films of the synthetic Cu-clays than in films of a natural montmorillonite. The larger peak currents obtained corresponded to 10- to 15-fold increases in the fractions of the adsorbed ions that were electrochemically oxidizable in the modified electrodes.

X-ray photoelectron spectroscopy (XPS) has been used to characterize the bonding state of Cu2+, Si4+, Al3+, and O2− ions in structural (octahedral and interlamellar) or adsorbed position in phyllosilicates. Five smectites, 5 kaolinites, and 1 chrysocolla with Cu(II) in known positions (octahedral, interlamellar, or surface adsorbed) have been investigated. Their spectra were compared with those of pure Cu metal and of pure Cu(I) and Cu(II) oxides.

The line for Cu 2p3/2 (binding energy of 935.4 eV) and well-defined shake-up lines (binding energy of about 943 eV) observed after 1 hr of X-ray irradiation are characteristic of Cu(II) in phyllosilicate octahedral sites. But due to the photoreduction effect, they show Cu(I) oxidation states (Cu 2p3/2, binding energy of 933.2 eV and near absence of shake-up lines) for the phyllosilicates with adsorbed Cu or in interlamellar positions. The kinetics of photoreduction distinguishes octahedral from interlamellar positions, and the latter from a surface adsorbed position. The enlargement of the FWHM (full width at half maximum) of XPS lines has been used to describe crystallochemical parameters linked to local ordering around the probe cations. Crystallization produces decreasing O 1 s and Cu 2p (octahedral cation) line widths but has no effect on the Si 2p (tetrahedral cation) line width. The enlargement of FWHM for all ion lines of the lattice is linked to the nature (Cu > Mg > Al) and the number and amount of structural cations in the phyllosilicates.