An algorithm was developed for the theoretical intensities of both X-ray continuum and characteristic K-radiation (Kα1, Kα2, Kα , Kβ1, Kβ2, Kβ3, Kβ13, Kβ4 and Kβ5) of different target materials (Cr, Cu, Rh, Mo, W, Ag and Au) at different electron incidence angles (0.01° − 90°), different take-off angles of the photon emission (0.01° − 90°) and different X-ray tube voltages. It was found that the intensities of continuum and characteristic X-rays increase with increasing take-off angle and the take-off angle is inversely proportional to the absorption path of X-rays in the target. At take-off angles of 20° or more, the flux of the X-ray spectra remains practically independent of the take-off angle. Furthermore, at the optimum electron incidence angle and take-off angle of emitted X-ray photons, the dependence of X-ray tube spectra on applied voltage was also investigated.