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Comparative study of UV radiation hardness of n+p and p+n duo-lateral position sensitive detectors

Published online by Cambridge University Press:  15 October 2014

Omeime Xerviar Esebamen ,
Göran Thungström ,
Hans-Erik Nilsson  and
Anders Lundgren
Omeime Xerviar Esebamen*
Affiliation:
Department of Information Technology and Media, Mid Sweden University, Holmsgatan 10, SE-85170 Sundsvall, Sweden
Göran Thungström
Affiliation:
Department of Information Technology and Media, Mid Sweden University, Holmsgatan 10, SE-85170 Sundsvall, Sweden
Hans-Erik Nilsson
Affiliation:
Department of Information Technology and Media, Mid Sweden University, Holmsgatan 10, SE-85170 Sundsvall, Sweden
Anders Lundgren
Affiliation:
SiTek Electro Optics, Ögärdesvägen 13A, SE-43330 Partille, Sweden
*
ae-mail: [email protected]
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Abstract

We report experimental results on the degree of radiation damage in two duo-lateral position sensitive detectors (LPSDs) exposed to 193 nm and 253 nm ultraviolet (UV) beam. One of the detectors was an in-house fabricated n+p LPSD and the other was a commercially available p+n LPSD. We report that at both wavelengths, the degradation damage from the UV photons absorption caused a much more significant deterioration in responsivity in the p+n LPSD than in the n+p LPSD. By employing a simple method, we were able to visualize the radiation damage on the active area of the LPSDs using 3-dimensional graphs. We were also able to characterize the impact of radiation damage on the linearity and position error of the detectors.

Type
Fast Track Article
Information
The European Physical Journal - Applied Physics , Volume 68 , Issue 2 , November 2014 , 21301
Copyright
© EDP Sciences, 2014

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