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D043 Phase Identification and Sequence Characterization in Ni-Si Thin Films at Low Temperature

Published online by Cambridge University Press:  20 May 2016

C. Coia ,
P. Desjardins ,
C. Lavoie  and
C. Detavernier
C. Coia
Affiliation:
École Polytechnique de Montréal, Montréal, Canada
P. Desjardins
Affiliation:
École Polytechnique de Montréal, Montréal, Canada
C. Lavoie
Affiliation:
IBM, T.J. Watson Research Center, Yorktown Heights, NY
C. Detavernier
Affiliation:
IBM, T.J. Watson Research Center, Yorktown Heights, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 175
Copyright
Copyright © Cambridge University Press 2003

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