Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-23T08:31:21.761Z Has data issue: false hasContentIssue false
  • English
  • Français

C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature

Published online by Cambridge University Press:  20 May 2016

P. Lechner ,
H. Soltau ,
C. Fiorini ,
A. Longoni ,
G. Lutz  and
L. Strüder
P. Lechner
Affiliation:
PNSensor GmbH, München, Germany
H. Soltau
Affiliation:
PNSensor GmbH, München, Germany
C. Fiorini
Affiliation:
Politecnico di Milano, Milano, Italy
A. Longoni
Affiliation:
Politecnico di Milano, Milano, Italy
G. Lutz
Affiliation:
MPI für Physik, München, Germany
L. Strüder
Affiliation:
MPI für extraterrestrische Physik, Garching, Germany
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 175
Copyright
Copyright © Cambridge University Press 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)