For the application of TXRF in trace element analysis, two characteristic features of the total reflection of X-rays are exploited. These are the high reflectivity on flat surfaces and the low penetration depth of the primary radiation. This allows the application of TXRF for both chemical trace and ultra-trace element analysis on the one hand and surface analysis on the other. For chemical trace clement analysis, total reflection on a highly polished substrate is characterized by a high reflectivity, which leads to a drastic reduction of the spectral background. The sample to be analyzed is prepared on the substrate as a residue of small quantities by evaporation from solutions or fine-grained suspensions. Instrumental detection limits of a few pg or sub-ng/ ml−1 arc state of the art for commercially available equipment. Besides the high detection power, internal standardization is another important feature of TXRF, enabling very simple quantification of the detected elements. The small sample mass required enables especially ultra-micro analytical questions to be tackled. For trace element analysis in surfaces the low penetration depth of the primary radiation under the conditions of total reflection is exploited. The penetration depth is in the range of a few nanometers, hence, TXRF is intrinsically surface sensitive. Detection limits better than 1010 atoms/cm2 are obtained for metal impurities on silicon wafers. For the examination of layered structures elemental composition, layer thickness, and density can be derived from die angle-dependent fluorescence intensities. The present paper describes the basic features of the total reflection of X-rays and gives some representative examples of the different uses of TXRF in trace element analysis.

An x-ray spectrometer has been designed for pixel by pixel analysis along lines or across selected areas of paintings and other art-objects. Characteristic technical data are: 0.8mm2 pixel size, 800mm (vert.) by 1000mm (horiz.) by 200mm (perpendicularly to object) motion distances, ±20μm precision in positioning the system, 2x3m maximum object size (mounted vertically); 2.8kW x-ray tube; Si(Li)detector. PC's are used for instrument control and new, complex data evaluation software.

Elastic modulus EI of crystalline regions of various high polymers in the direction parallel to the chain axis were measured using an X-ray diffraction method. The crystal deformation can be detected directly by the diffraction peak shift as a function of applied constant stress. The stress in the crystalline regions is assumed to be equal to that applied to the specimen. The validity of this assumption has been proven experimentally for polyethylene, poly(p-phenylene terephthalamide) and so on. The EI values were discussed in relation to molecular conformation and deformation mechanism of the chains.

A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures.

For the first time evidence is provided that a nanocrystalline and stacking-disordered, chemically stabilized β-cristobalite form of AlPO4 occurs in a sewage sludge ash (SSA). This proof is based on a combined X-ray powder diffraction and X-ray fluorescence investigation of an SSA produced at a large-scale fluidized bed incineration facility serving a catching area with a population of 2 million. The structural and chemical characterization was carried out on ‘as received’ SSA samples as well as on solid residues remaining after leaching this SSA in sodium hydroxide solution. Thus, it was ascertained that the observed nanocrystalline and stacking-disordered cristobalite-like component belongs to the aluminum phosphate component of this SSA, rather than to its silicon dioxide component. In addition, a direct proof is presented that the chemically stabilized β-cristobalite form of AlPO4 does crystallize from X-ray amorphous precursors under conditions that mimic the huge heating rate and short retention time (just seconds at T ≈ 850°C), typical for fluidized bed incinerators.

Building materials are very complex samples of worldwide importance; hence quantitative knowledge of their mineralogical composition is necessary to predict performances. Rietveld quantitative phase analysis (RQPA) allows a direct measurement of the crystalline phase contents of cements. We highlight in this paper the use of laboratory X-ray powder diffraction (LXRPD) employing high-energy radiation, molybdenum (Mo), for attaining the RQPA of cements. Firstly, we evaluate the accuracy of RQPA employing a commercial calcium sulfoaluminate clinker with gypsum. In addition to MoKα 1 and MoKα 1,2 radiations, Cu and synchrotron patterns are also analyzed for the sake of comparison. Secondly, the assessment of the accuracy of RQPA results obtained using different radiations (synchrotron, Mo, and Cu) and geometries (reflection and transmission) is performed by analyzing two well-known commercial samples. As expected, for LXRPD data, accuracy in the RQPA results improves as the irradiated volume increases. Finally, three very complex aged hydrated cements have been analyzed using MoKα1-LXRPD and Synchrotron-XRPD. The main overall outcome of this work is the benefit for RQPA of using strictly monochromatic MoKα 1 radiation. Best laboratory results arise from MoKα 1 data as the effective tested volume is much increased but peak overlapping is not swelled.

Leucites are silicate framework structures with some of the silicon framework cations partially replaced by divalent or trivalent cations. A monovalent extraframework alkali metal cation is also incorporated to balance the charges. We have previously reported Pbca leucite structures with the stoichiometries Cs2X2+Si5O12 (X = Mg, Mn, Co, Ni, Cu, Zn, Cd) and Rb2X2+Si5O12 (X = Mg, Mn, Ni, Cd). These orthorhombic leucite structures have all the silicon and non-silicon framework cations completely ordered onto separate crystallographic sites. This structure has five distinct Si sites and 1 X site; there are also two distinct sites for the extra-framework Cs or Rb. We have recently synthesised leucite analogues with two different extra-framework cations, these have the stoichiometry RbCsX2+Si5O12 (X = Mg, Ni, Cd). The initial Rietveld refinements assumed 50% Cs and 50% Rb on each of the two extra-framework cation sites. The refined structures for X = Ni and Cd have (within error limits) complete extra-framework cation site disorder. However, for X = Mg there is partial ordering of the extra-framework cation sites, the site occupancies are:- Cs1 0.37(3), Rb1 0.63(3), Cs2 0.63(3), Rb2 0.37(3).

Quantitative phase analysis of n-phase mixtures can be performed if at least n samples composed of no more than n identical phases are available. The fact that there is no need for pure phases (analytical standards) constitutes the main advantage of the method presented here. However, substitution for the pure phases by an unknown mixture of these phases decreases the diversity of the sample set and also the precision of the analysis. The crucial step in a standardless method is the creation of an initial sample set. A simple test is developed to estimate the suitability of the sample set for analysis and to evaluate the analysis error. Application of this test to 13 four-phase mixtures has confirmed its high quality.

The crystal structure of the high-temperature phase of Sr2ZnWO6 prepared by air quenching from 1200° C has been determined by means of X-ray powder diffraction. β-Sr2ZnWO6 belongs to the cubic system, with space group Fm3m and a lattice parameter a = 7.9266 Å at room temperature. Its measured density is Dm = 6.93g/cm3, and each unit cell contains four formula weights.

In the Bragg-Brentano X-ray powder diffractometer geometry the Automatic Divergence Slit (ADS) provides a fixed area of illumination on a flat specimen. For this case, the “constant volume” diffraction, appropriate for a Constant Divergence Slit (CDS) diffractometer, is not applicable and intensities must be corrected by a sinθ factor before comparison to CDS data.

It is shown that for thin layers the diffraction pattern may be treated as a “constant volume” diffraction case when the ADS is used. Moreover, the derivation of the unit cell dimensions using a common least-square procedure can result in excellent lattice parameters without using internal standards, because the transparency aberrations are minimized.

ADS data were obtained for a variety of reference materials including several NBS SRM powders. It was found that thin samples made of powder mixed with vaseline gave “constant volume” diffraction, less angular aberration, and yet had line intensities only somewhat less than bulk samples.

Three main benefits arise using a combination of thin layers and ADS: (a) The amount of material needed for routine chracterization is small, (b) The relative experimental intensities are approximately the same as those obtained from bulk specimens using a CDS. (c) The measured (Bragg) scattering angles are more accurate compared with those measured from bulk specimens.

Two compounds, [Co(NH3)5CO3]NO3·1/2H2O (labeled A) and [Co(NH3)4CO3]NO3·1/2H2O (labeled B), were obtained and characterized by X-ray powder diffraction. The samples were indexed using the programs TREOR90 and DICVOL91. In a monoclinic setting, the cell parameters are a=7.6661(3) Å, b=9.6212(3) Å, c=7.0725(4) Å, β=106.261(4)°, V=500.78 Å3, M20=36, F30=65 (0.0106, 44) for A and a=10.5623(5) Å, b=22.7304(18) Å, c=7.5174(5) Å, β=91.350(5)°, V=1804.31 Å3, M20=36, F30=82 (0.0071, 52) for B. The space group is probably P21/m(11) for A and P21/n(14) for B according to their reflection conditions.

Ni20[(C6H8O4)20(H2O)8]∙33H2O, a new nickel(II) 3-methylglutarate, was prepared hydrothermally (180 °C, 48 h, autogenous pressure) from a 1:1.5:2:180 mixture of nickel (II) sulphate hexahydrate, 3-methylglutaric acid, sodium hydroxide, and water. It crystallizes in the cubic system (space group P4332, Z=1) with a=16.8488(5) Å and V=4783.1(4) Å3. Its structure was solved from conventional X-ray powder diffraction data. It presents a three-dimensional network of edge-sharing nickel octahedra, lined by deprotonated organic anions. This remarkable oxide network with corrugated 20-membered rings is constructed from homochiral helices. The rings intersect each other to generate large crossing channels full of water along [111].

The boron and iron for aluminum substitution in the Rb-leucite structure (RbAlSi2O6, ICDD card 38-201) has been examined by sol-gel preparation of different samples along the three compositional joins Rb(X,Y)Si2O6, where X and Y are any two of the elements Al, Fe, B. The compound RbBSi2O6 (a0=12.831 Å) is here described and characterized by X-ray powder diffraction for the first time, while the compound RbFeSi2O6 is reexamined with a more precise determination of lattice parameters and diffraction intensities with respect to ICDD card 31-1189. The lattice parameters and the space groups of different selected terms of the three solid solutions are reported.

The crystal structures of solution-grown and melt-grown polycrystalline samples of n-hexatetracontane (n-C46H94) in the temperature range 293–359 K have been investigated by X-ray powder diffraction. The solution-grown sample has an orthorhombic structure, with space group Pbc21 and cell dimensions a=4.952 Å, b=7.424 Å, and c=120.95 Å. While heating this sample a gradual transition to a monoclinic phase takes place, with onset temperature 335 K. At temperatures close to the melting point two configurations of the ab plane have been observed. Cooling a sample from the melt results in a mixture of a monoclinic and an orthorhombic structure. Rietveld refinements of the structures of solution-grown and melt-grown samples at 293 K have been performed.

Synthesis and structure of two phosphates belonging to the ternary Sb2O5-Fe2O3-P2O5 system are reported. Structures of both SbV1.50FeIII0.50(PO4)3 and (SbV0.50FeIIIe0.50)P2O7 phases, obtained by solid state reaction in air atmosphere at 950 °C and 900 °C, respectively, were determined at room temperature from X-ray powder diffraction using the Rietveld method. Sb1.50Fe0.50(PO4)3 phosphate belongs to the Nasicon-type structure with R32 space group. Hexagonal cell parameters are ahex.=8.305(1) Å and chex.=22.035(2) Å. Rietveld refinement results show a 2-2 ordered distribution, along the c-axis, of X(1) and X(2) sites (crystallographic formula [Sb0.88Fe0.12]X(1)[Fe0.38Sb0.62]X(2)(PO4)3) in the Nasicon framework. (Sb0.50Fe0.50)P2O7 is isotypic with β-SbP2O7 pyrophosphate [Pna21 space group; a=7.865(1) Å, b=15.699(2) Å, c=7.847(1) Å]. Its crystal structure is built up from corner-shared SbO6 or FeO6 octahedra and P2O7 groups (two group types). Each P2O7 group shares its six vertices with three SbO6 and three FeO6 octahedra, and each octahedra is connected to six P2O7 groups. A quasi 1-1 ordered distribution, along the b-axis, of Sb5+ and Fe3+ ions in the pyrophosphate framework are observed.

The crystal structure of recently discovered chromium (III) dimagnesium trivanadate (V) Mg2CrV3O11 was refined using the Rietveld method. The crystal system of Mg2CrV3O11 is triclinic with space group P1− (Mg1.7Zn0.3GaV3O11 type) and lattice parameters a=6.4057(1) Å, b=6.8111(1) Å, c=10.0640(2) Å, α=97.523(1)°, β=103.351(1)°, γ=101.750(1)°, and Z=2. The characteristic feature of compounds in the A2BV3O11 (A=Mg, Zn and B=Ga, Fe, Cr) family is a strong tendency to share the octahedral M(1) and M(2) sites by both divalent A and trivalent B atoms, and the bipyramidal M(3) sites occupied by divalent A ions. In the present refinement, the only constraint assuming full occupancy of the M(1), M(2), and M(3) sites leads to the following Cr/(Cr+Mg) ratios: 0.70(2) at M(1), 0.24(2) at M(2), and 0.03(2) at M(3). These occupancies are discussed and compared to those of isotypic compounds. The values of interatomic distances are found to be comparable with those reported by R. D. Shannon in 1976. Electron paramagnetic resonance has been also analyzed. Two absorption lines with g≈2.0 (type I) and g≈1.98 (type II) have been recorded in the EPR spectra, and attributed to V4+ ions and Cr3+–Cr3+ ion pairs, respectively. The exchange constant J between Cr3+ ions has been calculated.

Ten fragments of bronze age frescoes from the Greek group of volcanic islands known as Santorini have been examined by powder X-ray diffraction. A qualitative phase analysis based on line positions only was supplemented by the Rietveld method which uses complete diffraction profiles to increase the credibility of the phase analysis.

Four compounds in the hexafluoroniobates IV series MNbF6 (M=Ca, Mg, Cd, Zn) have been synthesized by solid-state reactions. CaNbF6, MgNbF6, and the “high temperature” form of CdNbF6 are isostructural with f.c. cubic NaSbF6 (space group Fm3m). ZnNbF6 and the room temperature form of CdNbF6 are isostructural with rhombohedral LiSbF6 (space group R3¯). Syntheses and powder diffraction data are reported.

A nonlinear optical material, N-(p-methoxy benzoyl)-N′-(p-methyl phenyl) thiourea (C16H16N2O2S), has been characterized by X-ray powder diffraction. Experimental values of 2θ corrected for systematic errors, relative peak intensities, values of d, and the Miller indices of 94 observed reflections with 2θ up to 66° are reported. The powder diffraction data and the figure-of-merit are reported. The least-squares refined unit cell parameters are a=25.3291(3) Å, b=11.9478(1) Å, c=10.1407(4) Å, β=103.10(2)°, V=2988.97(6) Å3, Z=8, Dx=1.335(0) g/cm3, with space group P21(4).

Sm2Bi2Ti3O12 was synthesized by solid state reaction from Sm2O3, Bi2O3, and TiO2 in molar relation 1:1:3. Title compound is isostructural with Bi4Ti3O12. Products of the reaction were analyzed by X-ray diffraction methods. The crystal structure was refinement by the Rietveld Method. Cell parameters are: a=5.368(2), b=5.369(2), and c=32.71(2) Å, space group Fmmm. The final R value was 9.96% (Rw=13.43%).© 1998 International Center for Diffraction Data.