Some kinds of plastic deformation leave a residual pseudo-macrostress in the material. The existence of this stress in certain specimens introduces errors into the standard x-ray measurement of residual macrostress, namely, in specimens that have been stretched, compressed, bent, rolled, or drawn.

No error is involved in x-ray measurements on peened, ground, or machined surfaces, or in specimens where the source of the stress is remote from the surface examined.

The x-ray and magnetic evidence for pseudo-macrostress is reviewed.

The use of quantitative x-ray diffraction (XRD) as an analytical technique has recently become increasingly popular. There ate primarily two reasons for this increasing interest in a relatively old discipline. The first is simply the need for quantitative phase analysis. This need arises from several sources such as government regulations on respiratory quartz, industrial quality control, and material research. X-ray diffraction provides a readily available technique for bulk phase analysis on chemically similiar phases. For phases which are elementally distinct, our sister science, x-ray fluorescence, can more easily provide the quantitation needed. The second reason for the increasing interest in quantitative XRD is the ready availability of automated powder diffractometers. These instruments remove much of the tedium involved in the collection and reduction of the data.

High resolution X-ray powder diffraction data have been collected with Bragg-Brentano geometry on samples of MgO using Ni-filtered and graphite-monochromated CuKαradiation. Selection of the characteristic radiation by Ni-filtering produces severe peak asymmetry, truncates the low-angle foot of the peak, lowers the general level of background on the low angle side, and leaves a remnant Kβpeak for all foils of reasonable thickness. When step-scan data produced by this method are used for Rietveld analysis, all of these features cause difficulties in fitting a smooth function to the background and in successfully modelling the detailed profiles of the peaks. On the other hand, Kαradiation from a diffracted-beam monochromator provides inherently more symmetric peaks and a smoothly varying background on both sides of the peak centre, both of which effects can be adequately modelled during Rietveld analysis. The primary disadvantage with monochromation is that, even with very careful setting of the pulse height discrimination, the monochromator may pass a small proportion of the λ/2 component of the incident radiation. In samples containing small quantities (i.e., 2 wt%, or less) of impurity phases, the undesirable features of the diffractometer profile (i.e., asymmetric and truncated background, and Kβand λ/2 peaks) can be of similar intensity to the main peaks arising from the impurities (as well as substructure peaks from the primary phases), thereby leading to difficulties in their identification and quantification. Nevertheless, with due care and long data collection times, the abundances of minor phases can be measured with Rietveld analysis down to levels of the order of 0.1 wt%.

Improved X-ray powder diffraction data for synthetic PdSn are reported. Powder diffraction data were collected with a laboratory X-ray source (CuKα) for Rietveld refinement. Refined crystallographic data for PdSn (orthorhombic, Pnma) are a=6.1388(4), b=3.89226(3), c=6.3377(4) Å, V=151.43(2) Å3, Z=4, and Dx=9.87 g∕cm3.

Quantitative comparisons between patterns from PDF-4 and experimental data using the Integral Index method are presented. The software integrated into the PDF-4 (DDView+) provides the ability to calculate fully digitized diffraction patterns for all 272,232 entries (PDF-4+ 2007). To provide a means of quantitative comparison between entries in the Power Diffraction File (PDF) and experimental data obtained in the laboratory, data filtering using Boolean logic has been used to reduce the size of the comparison set. Within this comparison set, we have used the Integral Index method to provide quantitative comparisons between digitized patterns obtained from the PDF-4 and experimental data. The quantitative aspects facilitate total pattern matching, that is, selecting the pattern in the PDF-4 that most closely matches input experimental data. Several examples will be used to illustrate the pattern matching process and the utility of this approach will be examined.

This manuscript describes the construction, testing, and use of a simple side-loading air-tight specimen holder for use with Bruker X-ray powder diffractometers.

The binary phase diagram of para-dibromobenzene and para-chloroiodobenzene is characterized by a partial miscibility with a peritectic invariant. Unit cell parameters have been determined and their variation analyzed as a function of composition.

X-ray powder diffraction of Nitrofurantoin C8H6N4O5 reveals that the compound crystallizes in a monoclinic unit cell with the powder data unit cell parameters of a = 7.852(2), b= 6.497(1), c = 18.927(5) Å, β=93.15(2)°, V=964.1(2) Å3. The unit cell dimensions determined by single crystal agree very well with those of powder diffraction analysis. A comparison with the Powder Diffraction File (PDF) 34-1603 indicates that the present data provide a more precise match to the unit cell, include additional weak reflections, along with the indexing of the powder pattern.

Structural properties of Cd1−xCuxCr2O4(CCCO) have been investigated by means of X-ray powder diffraction and Rietveld analysis. A structural phase transformation from Fd3m to I42d at x=0.64 has been detected. The lattice constant a of the cubic unit cell decreases rapidly with increasing Cu content up to x=0.62. At x=0.64, the cubic unit cell is compressed into a tetragonal cell and CrO6 octahedrons are distorted. With continuing Cu content increases above 0.64, the distortion of the unit cell is released slightly according to the changes in c/a. Magnetic properties of Cd1−xCuxCr2O4(x=0.1,0.3,0.5,0.7) have also been measured and are discussed.

Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil.

Mixed solvent of ethanol and water using FeSO4⋅7H2O and (NH2)2CS as precursors with polyvinylpyrrolidone as surfactant was used to synthesize cubic FeS2 (pyrite) crystals. Crystalline phase and surface morphologies of the crystals were characterized by X-ray diffraction and scanning electron microscopy, respectively. Volume ratio of solvent, reaction temperature, reaction time, and sulfur source were found to be the key parameters for the formation of pure pyrite crystals. Optimal micron-size pyrite crystals were successfully grown from a mixed solvent of ethanol and water with a volume ratio of 3:2, heated to a reaction temperature of 180 °C, and maintained for 36 h with thiourea as the sulfur source.

Lithol reds belong to the group of azo pigments, which were popular artists’ colouring materials in the first half of the twentieth century. These pigments were also used in many branches of industry. Here, we report X-ray powder diffraction data, unit-cell parameters, and space groups for three compounds from this group: sodium (E)-2-((2-hydroxynaphthalen-1-yl)diazenyl)naphthalene-1-sulphonate monohydrate (Na lithol red), monoclinic, space group C2/c, with cell parameters a = 33.343(7), b = 6.667(2), c = 16.397(4) Å, β = 90.83°, V = 3644.51 Å3, Z = 8; barium (E)-2-[(2-hydroxynaphthalen-1-yl)diazenyl]naphthalene-1-sulphonate trihydrate (Ba lithol red), monoclinic, space group P21/m, with cell parameters a = 17.758(9), b = 6.209(4), c = 16.857(8) Å, β = 92.07°, V = 1857.39 Å3, Z = 2; and ammonium (E)-2-[(2-hydroxynaphthalen-1-yl)diazenyl]naphthalene-1-sulphonate monohydrate (NH4 lithol red), monoclinic, space group P2/c, with cell parameters a = 17.721(5), b = 6.428(3), c = 16.911(5) Å, β = 100.31(3)°, V = 1895.31 Å3, and Z = 4. In the first and third cases we synthesised the pigments in their monohydrate form, performed X-ray powder diffraction measurements, and indexed all of the obtained diffraction maxima. In the case of the barium compound, despite many efforts in the course of the synthesis procedure, the powder diffraction patterns of the obtained samples were not of the best quality. Nevertheless, we indexed the best one and found a reliable space group and cell parameters.

Retained austenite is an important characteristic of properly heat-treated steel components, particularly gears and shafts, that will be subjected to long-term use and wear. Normally, either X-ray diffraction or optical microscopy techniques are used to determine the volume percent of retained austenite present in steel components subjected to specific heat-treatment regimes. As described in the literature, a number of phenomenological, experimental, and calculation factors can influence the volume fraction of retained austenite determined from X-ray diffraction measurements. However, recent disagreement between metallurgical properties, microscopy, and service laboratory values for retained austenite led to a re-evaluation of possible reasons for the apparent discrepancies. Broad, distorted X-ray peaks from un-tempered martensite were found to yield unreliable integrated intensities whereas diffraction peaks from tempered samples were more amenable to profile fitting with standard shape functions, yielding reliable integrated intensities. Retained austenite values calculated from reliable integrated intensities were found to be consistent with values obtained by Rietveld refinement of the diffraction patterns. The experimental conditions used by service laboratories combined with a poor choice of diffraction peaks were found to be sources of retained austenite values containing significant bias.

The texture of sheet metal Is best described, by means of pole figures, which are very expensive and time-consuming to prepare. About 8 to 12 hours of effort by a specially trained, and. highly skilled technician are needed to prepare each pole figure. Accordingly, pole figures are not used as extensively in research studies as they would, be if they could be obtained more easily.

A method has been developed for automatically producing pole figures by printing results directly from a digital computer. This method does not require the use of additional plotting attachments and, is therefore less expensive and time consuming than other methods. With this method, any laboratory with access to a digital computer can produce pole figures automatically.

X-ray diffraction intensities are recorded on punched tape or on punched cards and are fed into the digital computer. A computer program corrects X-ray data obtained, by either transmission or reflection X-ray techniques, maps the stereographic projection, and prints pole figures directly. The time required, to prepare an accurate pole figure is reduced from 8 to 12 hours to 20 minutes or less depending on the type of digital computer used.

Two high-temperature X-ray diffraction cameras are described which have been employed at Battelle to determine thermal expansion of metals and ceramic materials. Specimen preparation and temperature measurement and control are described. Lattice-parameter data vs. temperature are presented for uranium, uranium dioxide, and magnesium oxide.

The use of non-radioactive tracers for measuring certain clinically significant parameters by x-ray fluorescence analysis (XRFA) is well established at our institution (1,2). Among the technique's advantages are high accuracy, simplicity, cost effectiveness and reduced or eliminated radiation exposure to patients. One of the more versatile tracers is iodine, which has a low body toxicity and desirable chemical properties, e.g. it is easily bound to organic molecules. Other elements of interest are cesium (3), a potassium analogue of low toxicity; and xenon, the highest atomic number, stable, noble gas.

The diffraction of X-rays by multilayer stearate soap films has been studied as a function of (a) the number of diffracting layers and (b) the bivalent metal present. Both “Y” and “X” type structures have been built and analyzed with Al and C Kα radiation. The measured diffraction efficiency is compared with that predicted theoretically and with that obtained from a single crystal such as potassium acid phthalate.

The silicon diode array camera tube, recently developed for PICTURFPHONE® service, was modified to permit X-ray imaging. High quantum efficiency is attained without the use of a phosphor screen, since each photon absorbed in the silicon target generates several hundred hole-electron pairs for each keV of its energy, most of which can he usefully collected. The sensitivity and resolution are adequate to allow a continuous television display of the diffracted intensity as a crystal is oriented. Particular advantages of this technique include; high resolution (< 25 μm); electronically variable magnification; direct oscilloscope measurement of X-ray spot Intensity profiles and relative spot intensities because signal current is directly proportional to photon flux; high sensitivity in the range of 0.6 to 5.0 Å, potentially limited only "by counting statistics; integration times variable from < 1/60 second to minutes; and expected low cost, since the camera tube has no complicated electron imaging, and is directly interchangeable Mith a standard television vidicon. Applications which are described include crystal orientation and X-ray topography.

The Monte Carlo simulation method that has been previously developed and demonstrated for EDXRF analysis with annular radioisotope excitation sources is extended to systems using secondary fluorescer X-ray machines for excitation. Comparisons of the Monte Carlo predictions with experimental results indicate that the modification is valid.

A simple two-crystal spectrometer was constructed, making use of a commercial one-crystal spectrometer. A detector attached to a 2θ-arm has been replaced by a second crystal. After adjustment, the second crystal is fixed to the 2θ-arm. The detector is placed at an appropriate position apart from the 2θ-arm. The spectrometer is operated as if it were a one-crystal spectrometer. The dispersion of the spectrometer in this mode of operation is the sum of those of the first and second crystals. Ge(220) crystals gave the best resolution which was about 3-3 eV fwhm for Cu Kα1. The strongest Intensity was observed using etched LIF crystals. The intensity was about 1/4 of that of a one-crystal spectrometer and the resolution was about 9.5 eV fwhm for Cu Kα1. The spectrometer was applied to the determination of hafnium in zirconium and sircaloy. The Zr Kα 2nd order line, which coincides with the Hf Lα1 line, was completely eliminated by successive reflections by Ge(111) crystals owing to the extinction rule and the high resolving power. The detection limit was about 7 ppm of hafnium. Another example is the separation of the As Kα2 line from the Pb Lα1 line. Arsenic in low alloy steel was determined without the correction for the well known Interference of lead. The very common interference of Cr Kβ on Mn Kα was also eliminated completely by this spectrometer. Though the spectrometer is not very suitable for a wide wavelength range spectroscopic measurement, owing to its narrow window region (about ±1°), the chemical effects on Kg spectra of sulfur in various compounds were investigated. Fine structures were found In the sulfur Kβ spectra of several thiocyanates and elemental sulfur. To observe long wavelength region spectra, the X-ray path of the spectrometer was modified to a hybrid path (vacuum and helium).