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X-ray powder diffraction analysis of a nonlinear optical material N-(p-methoxy benzoyl)-N-(p-methyl phenyl) thiourea

Published online by Cambridge University Press:  05 March 2012

Weiqun Zhou
Affiliation:
Chemistry Department, Suzhou University, 1 Shizi Street, Suzhou, 215006, People’s Republic of China
Chao Xie
Affiliation:
EENT Hospital, Suzhou, 215006, People’s Republic of China
Zheng Jin
Affiliation:
Suzhou Testing Institute of Technology, 5 Minzhi Road, Suzhou, 215006, People’s Republic of China
Zong-ming Jin*
Affiliation:
Central Laboratory, Suzhou University, 1 Shizi Street, Suzhou, 215006, People’s Republic of China
*
a)Electronic mail: [email protected]

Abstract

A nonlinear optical material, N-(p-methoxy benzoyl)-N-(p-methyl phenyl) thiourea (C16H16N2O2S), has been characterized by X-ray powder diffraction. Experimental values of 2θ corrected for systematic errors, relative peak intensities, values of d, and the Miller indices of 94 observed reflections with 2θ up to 66° are reported. The powder diffraction data and the figure-of-merit are reported. The least-squares refined unit cell parameters are a=25.3291(3) Å, b=11.9478(1) Å, c=10.1407(4) Å, β=103.10(2)°, V=2988.97(6) Å3, Z=8, Dx=1.335(0) g/cm3, with space group P21(4).

Type
New Diffraction Data
Copyright
Copyright © Cambridge University Press 2002

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