Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-23T19:17:37.090Z Has data issue: false hasContentIssue false

X-Ray Powder Diffraction Data for β-Lead Telluride

Published online by Cambridge University Press:  10 January 2013

Charles A. Peck
Affiliation:
Metallurgy Department, General Motors Research Laboratories, Warren, Michigan 48090, U.S.A.
Robert B. Ruokolainen
Affiliation:
Metallurgy Department, General Motors Research Laboratories, Warren, Michigan 48090, U.S.A.

Abstract

50-50 atomic percent lead telluride (Altaite), grown by the vapor transport method, was examined with a well aligned Rigaku horizontal beam diffractometer. PbTe is cubic (precise lattice parameter ao = 6.4591(5)Å) with an space group and a calculated density of 8.253 g/cm3. Fully indexed powder diffraction data are presented.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Cabera, N. and Coleman, R. V. (1963). The Art and Science of Growing Crystals, 3. New York: J. Wiley and Sons.Google Scholar
Cullity, B. D. (1978a). Elements of X-Ray Diffraction, 355. Reading, MA: Addison-Wesley.Google Scholar
Cullity, B. D. (1978b). Elements of X-Ray Diffraction, 327.Google Scholar
Klug, H. P. and Alexander, L. E. (1954). X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials. First ed., 464465. New York: J. Wiley and Sons.Google Scholar
Powder Diffraction File (1986). Swarthmore, PA: International Centre for Diffraction Data.Google Scholar
Smith, G. S. and Snyder, R. L. (1979). J. Appl. Crystallogr. 12, 6065.CrossRefGoogle Scholar
Thompson, R. M. (1949). Am. Mineral. 34, 361.Google Scholar