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X-Ray Diffractometry of Low-Mass Samples

Published online by Cambridge University Press:  10 January 2013

L. S. Zevin  and
I. M. Zevin
L. S. Zevin
Affiliation:
Materials Engineering Department and The Institute for Applied Research, Ben-Gurion University of the Negev, P.O. Box 1025, Beer-Sheva 84110, Israel
I. M. Zevin
Affiliation:
Materials Engineering Department and The Institute for Applied Research, Ben-Gurion University of the Negev, P.O. Box 1025, Beer-Sheva 84110, Israel
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Abstract

The intensity diffracted by a low-mass sample with negligible absorption may be expressed as It = I∞ (B/2μ*)/G, where I∞ = intensity diffracted by a bulk sample, B = cross section of the primary beam, μ* = mass absorption coefficient, and G = mass of the sample. Measurable intensity may be obtained from samples with less than 1 μg mass. In order to improve the limit of detection, the primary beam should be collimated so as to irradiate the sample and only a minimum volume of the sample support. The optimum spreading area of a low-mass sample is S sinθ≅10μ*. Comminution of low-mass samples to 1 — 2μm particles is adequate for reasonable intensity measurements.

Type
Research Article
Information
Powder Diffraction , Volume 2 , Issue 2 , June 1987 , pp. 78 - 81
Copyright
Copyright © Cambridge University Press 1987

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