Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-23T19:39:14.827Z Has data issue: false hasContentIssue false
  • English
  • Français

A Simple System for Enhanced Data Collection From a Powder Diffractometer

Published online by Cambridge University Press:  10 January 2013

K. D. Rogers  and
D. W. Lane
K. D. Rogers
Affiliation:
Royal Military College of Science, Shrivenham, Swindon, Wilts. SN6 8LA, U.K.
D. W. Lane
Affiliation:
Royal Military College of Science, Shrivenham, Swindon, Wilts. SN6 8LA, U.K.
Get access Rights & Permissions [Opens in a new window]

Abstract

A Siemens D500 powder diffractometer has been modified to accommodate data collection and storage by an IBM microcomputer. The interface mechanism, described in detail, is simple, versatile and relatively low cost. The system performance is evaluated and further enhancements suggested.

Type
Research Article
Information
Powder Diffraction , Volume 2 , Issue 4 , December 1987 , pp. 227 - 229
Copyright
Copyright © Cambridge University Press 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

AMD (1985). AM9513 Handbook. AMD Literature Distribution. A.M.D. House, Goldsworth Road, Woking, Surrey, GU21 1JT.Google Scholar
Bates, P. & Price, D. C. (1987). J. Phys. E., 20, 51–54.CrossRefGoogle Scholar
Clegg, W. (1984). Methods and Applications in Crystallgraphic Computing, ed. Hall, S. R. & Ashida, T., 19–29. Oxford: Clarendon Press.Google Scholar
Cosier, J., Glazer, A. M., Hastings, T. J., Smith, D. T. & Wood, I. G. (1981). J. Phys. E., 14(2), 170–174.CrossRefGoogle Scholar
McMurdie, H. F., Morris, M. C., Evans, E. H., Paretzkin, B., Wong-Ng, W. & Hubbard, C. R. (1986). Pow. Diff. 1 (1), 40–43.CrossRefGoogle Scholar
Scientific Solutions Inc., (1985). Lab Tender Installation Manual. Users Guide. Number 931677 Rev. A. Available from Electroplan Limited, P.O. Box 19, Orchard Road, Royston, Hertforshire. U.K.Google Scholar
Sparks, R. A. (1982). Computational Crystallography, ed. Sayre, D., 1–19. Oxford: Clarendon Press.Google Scholar
Snyder, R. L., Hubbard, C. R. & Panagiotopoulos, N. C. (1981). Auto: A Real Time Diffractometer Control System Report, NBSIR 81-2229, U.S. Dept. of Commerce, Natl. Bur. Stand. Gaithersburg, M.D. 20899.CrossRefGoogle Scholar