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Quantitative Phase Analysis By Linear Regression of Chemistry on X-Ray Diffraction Intensity
Published online by Cambridge University Press: 10 January 2013
Abstract
XRF and XRD measurements made on a single pressed powder briquet can be combined to give more quantitative information than either technique employed alone. Speed of analysis and simplification of sample preparation are also enhanced. The algorithm presented here uses multiple linear regression of the concentrations of one or more elements on the corrected X-ray diffraction intensities of the phases containing them. The data reduction program runs on a microcomputer. Data are presented to show its application to mineralogical analysis of artificial mixtures of quartz, microcline (a feldspar) and calcite.
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- Copyright © Cambridge University Press 1987
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