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Certification of Standard Reference Material 1976B

Published online by Cambridge University Press:  12 August 2015

David R. Black ,
Donald Windover ,
Marcus H. Mendenhall ,
Albert Henins ,
James Filliben  and
James P. Cline
David R. Black*
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Donald Windover
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Marcus H. Mendenhall
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Albert Henins
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
James Filliben
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
James P. Cline
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation of this powder diffraction SRM. SRM 1976b consists of a sintered alumina disc, approximately 25.6 mm in diameter by 2.2 mm in thickness, intended for use in the calibration of X-ray powder diffraction equipment with respect to line position and intensity as a function of 2θ-angle. The sintered form of the SRM eliminates the effect of sample loading procedures on intensity measurements. Certified data include the lattice parameters and relative peak intensity values from 13 lines in the 2θ region between 20° and 145° using CuKα radiation. A NIST-built diffractometer, incorporating many advanced and unique design features was used to make the certification measurements.

Keywords

Standard Reference MaterialX-ray diffractioncertificationlattice parameterdiffractometer
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Issue 3 , September 2015 , pp. 199 - 204
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Copyright
Copyright © International Centre for Diffraction Data 2015 

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