To improve the cell efficiency of thin film solar cells textured back reflectors (BR) are widely used. This is particularly important in a-Si:H based solar cells due to low absorption coefficient at longer wavelengths. In this work we present a cost effective way to fabricate uniformly textured ZnO by using electrochemical methods. Further it was observed that Quantum Efficiency (QE) of shorter wavelengths also improved for highly textured ZnO BR. Together this resulted in more than 2mA increment in short circuit current density (Jsc) and 19% relative improvement in solar cell efficiency over sputter deposited BR. A possible mechanism responsible for the improved blue QE is also discussed.

In this work we have developed optical models for the ellipsometric characterization of Bi-implanted CdTe. We have characterized the amount and nature of disorder using Rutherford Backscattering Spectrometry combined with channeling (RBS/C). Samples with a systematically varying degree of disorder were prepared using ion implantation of Bi into single-crystalline CdTe at an energy of 350 keV with increasing doses from 3.75×1013 cm-2 to 6×1014 cm−2. The motivation for use of the high atomic mass Bi ions was that previous studies using lighter ions revealed damage at a low level, even for doses several times higher than the amorphization threshold estimated by simulation [P. Petrik et al., phys. stat. sol. (c) 5, 1358 (2008)]. In contrast, Bi ions create sufficient disorder for investigation of the changes in dielectric function critical point (CP) features in a wider variety of structures from single-crystalline to the disordered state. The CP features can be described by numerous methods starting from the standard CP model, through the parameterization of Adachi [Adachi et al., J. Appl. Phys. 74, 3435 (1993)], and finally to the generalized CP models. The standard CP model has been demonstrated to be a reliable approach for polycrystalline CdTe characterization used in photovoltaic applications [Li et al., phys. stat. sol. (a) 205, 901 (2008)].

We evaluate four techniques that image minority carrier lifetime, carrier diffusion length, and shunting in solar cells. The techniques include photoluminescence imaging, carrier density imaging, electroluminescence imaging, and dark lock-in thermography shunt detection. We compare these techniques to current industry standards and show how they can yield similar results with higher resolution and in less time.

With tunable bandgap and demonstrated high efficiency, the chalcopyrite CuInSe2 and its alloys have shown great potential as absorbers for single and multi-junction solar cells. However, the current deposition techniques mostly rely on expensive vacuum-based processing or involve complicated precursor solution preparation. These higher-cost absorber preparation processes make it difficult to commercialize this technology. In this work, CuInSe2−xSx (CIS) absorbers are deposited using a simple hydrazine-based solution process. Precursor solutions were prepared by dissolving the component metal chalcogenides and chalcogen in hydrazine, forming homogeneous solutions containing adjustable concentrations of desired elements mixed on a molecular level. These precursor solutions are then spin coated on substrates followed by a heat treatment in an inert environment to produce high quality CIS thin films. Significantly, no post deposition selenization process is required using this technique. Laboratory scale devices with conventional glass/Mo/CIS/CdS/i-ZnO/ITO structure have been fabricated using CIS absorbers deposited via this process. For the baseline low-bandgap CIS system with no Ga added (to compare with our previously reported results with Ga incorporated), AM1.5G conversion efficiency of as high as ∼9% has been achieved for devices with 0.45 cm2 effective area.

The influence of edges on the performance of small-area solar cells is determined using a modified commercial, finite-element software package. The n+/p mesa device is modeled as having a sub-oxide layer on the edges, which acquires positive charges that result in development of an electric field within the device. Our computer simulations include generation/ recombination at the diode edges as well as the influence of light on the recombination characteristics of the edges. We present a description of our model, dark and illuminated characteristics of devices with various surface charge concentrations, and the dynamics of carrier generation/recombination. The influence of edge geometry on diode performance is determined.

We present optical properties and microstructure analyses of hydrogenated silicon suboxide layers containing silicon nanocrystals (nc-SiOx:H). This material is especially adapted for the use as intermediate reflecting layer (IRL) in micromorph silicon tandem cells due to its low refractive index and relatively high transverse conductivity. The nc-SiOx:H is deposited by very high frequency plasma enhanced chemical vapor deposition from a SiH4/CO2/H2/PH3 gas mixture. We show the influence of H2/SiH4 and CO2/SiH4 gas ratios on the layer properties as well as on the micromorph cell when the nc-SiOx:H is used as IRL. The lowest refractive index achieved in a working micromoph cell is 1.71 and the highest initial micromoph efficiency with such an IRL is 13.3 %.