The present work reports the synthesis of self-organized strontium-doped titania nanotubes arrays as a potential material for photocatalytic water splitting. Electrochemical anodization process was used to grow such material under various electrochemical conditions. The effect of dopant concentration on the morphology and photoelectrochemical properties of the material was investigated. The microstructure, morphology and composition of as-prepared and heat treated nanotubes were characterized by field emission scanning electron microscopy (FESEM), x-ray diffraction (XRD), transmission electron microscopy (TEM) and x-ray photoelectron spectroscopy (XPS). The results showed that increasing the dopant concentration up to its solubility limit results in higher photoelectrochemical activity. A preliminary proof of concept of the photocatalytic activity of the fabricated material was estimated in terms of the use of such material as a photoanode for photoelectrochemical water splitting.

The combination of a solid photocatalyst (TiO2) and a co-catalyst (p-toluenesulfonic acid) has been successfully applied for the light-induced conversion of nitroarenes in O2-free ethanolic suspensions yielding substituted quinolines and tetrahydroquinolines, while in the presence of TiO2 loaded with a noble metal (Pt, Pd) N-alkylarylamines and N,N-dialkylarylamines were formed. Depending on the compounds that have been detected by GC–MS the reaction mecha-nism is discussed comprising the formation of anilines and ethanal by a photocatalytic reaction step and their subsequent thermal reactions to quinolines, tetrahydroquinolines, and N-alkylated anilines via a Schiff base as an intermediate product.

Creating optical quality thin films with a high refractive index is increasingly important for waveguide sensor applications. In this study, we present optical models to measure the layer thickness, vertical and lateral homogeneity, the refractive index and the extinction coefficients of the polymer films with nanocrystal inclusions using spectroscopic ellipsometry. The optical properties can be determined in a broad wavelength range from 190 to 1700 nm. The sensitivity of spectroscopic ellipsometry allows a detailed characterization of the nanostructure of the layer, i.e. the surface roughness down to the nm scale, the interface properties, the optical density profile within the layer, and any other optical parameters that can be modeled in a proper and consistent way. In case of larger than about 50 nm particles even the particle size can be determined from the onset of depolarization due to light scattering. Besides the refractive index, the extinction coefficient, being a critical parameter for waveguiding layers, was also determined in a broad wavelength range. Using the above information from the ellipsometric models the preparation conditions can be identified. A range of samples were investigated including doctor bladed films using TiO2 nanoparticles.