Symposium Z – Specimen Preparation for Transmission Electron Microscopy…IV
Research Article
Cross sectional Tem Sample Preparation Using E-Beam Lithography and Reactive ion Etching
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- Published online by Cambridge University Press:
- 10 February 2011, 217
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The Use of a Cold Gas Plasma for the Final Processing of Contamination-Free Tem Specimens
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- Published online by Cambridge University Press:
- 10 February 2011, 225
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A New Procedure for Making Tem Specimens of Superconductor Devices
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- Published online by Cambridge University Press:
- 10 February 2011, 235
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Preparation of Multilayered Materials in Cross-Section for in-Situ Tem Tensile Deformation Studies
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- Published online by Cambridge University Press:
- 10 February 2011, 245
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Cross-Sectional Tem Sample Preparation of Phase-Change Optical Disk by Ion Milling
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- Published online by Cambridge University Press:
- 10 February 2011, 251
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In-Situ Transmission Electron Microscopy of the Solid-Phase Epitaxial Growth of GaAs: Sample Preparation and Artifact Characterization
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- Published online by Cambridge University Press:
- 10 February 2011, 257
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An Updated Ion Polishing System for Tem Specimen Preparation of Materials
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- Published online by Cambridge University Press:
- 10 February 2011, 263
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