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Thin HgCdTe LPE Layers Grown on CdTe and CdZnTe Substrates

Published online by Cambridge University Press:  22 February 2011

Kosaku Yamamoto ,
Tohru Maekawa  and
Hiroshi Takigawa
Kosaku Yamamoto
Affiliation:
Fujitsu Laboratories Ltd., Infrared Devices Laboratory 10-1 Morinosato-Wakamiya, Atsugi, 243-01, Japan
Tohru Maekawa
Affiliation:
Fujitsu Laboratories Ltd., Infrared Devices Laboratory 10-1 Morinosato-Wakamiya, Atsugi, 243-01, Japan
Hiroshi Takigawa
Affiliation:
Fujitsu Laboratories Ltd., Infrared Devices Laboratory 10-1 Morinosato-Wakamiya, Atsugi, 243-01, Japan
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Abstract

The dependence of the growth pattern of thin HgCdTe LPE layers on lattice mismatch was investigated. Epilayers grown on substrates with a lattice mismatch of more than 0.2% show island-like growth, which are aligned with the network of misfit dislocation lines. Thin epilayers grown on substrates with a lattice mismatch of less than 0.05% have mirror-like flat surfaces. It was found that the surface defects for thick epilayers also have a lattice-mismatch dependency.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 130: Symposium C – Thin Films: Stresses and Mechanical Properties I , 1988 , 315
Copyright
Copyright © Materials Research Society 1989

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References

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