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SEMICONDUCTOR BEHAVIOR OF 2, 5-AROMATIC DISUBSTITUTED PYROLLES, AN EXPERIMENTAL AND THEORETICAL STUDY

Published online by Cambridge University Press:  18 December 2012

L. Fomina ,
C. Y. León Valdivieso ,
G. Zaragoza Galán ,
M. Bizarro ,
I. P. Zaragoza ,
J. Godínez Sánchez ,
R. Salcedo  and
A. Baeza
L. Fomina
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
C. Y. León Valdivieso
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
G. Zaragoza Galán
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
M. Bizarro
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
I. P. Zaragoza
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
J. Godínez Sánchez
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
R. Salcedo
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
A. Baeza
Affiliation:
Facultad de Química- Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México.
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Abstract

Theoretical calculations were performed on 2, 5-aromatic substituted pyrroles which have a nitro-benzene or a cyano-benzene link to the nitrogen atom of the pyrrol fragment. The molecules manifested interesting semiconductor behavior that was confirmed when thin films were prepared and their corresponding electrical characterization undertaken. The reason for this behavior is discussed, with reference to the electron withdrawing feature of the substituents in the benzene chain.

Keywords

Simulationelectronic materialsemiconducting
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1483: Symposium S – New Trends in Polymer Chemistry and Characterization , 2012 , imrc12-1483-s5b-p003
Copyright
Copyright © Materials Research Society 2012 

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References

REFERENCES

Brédas, J.L., Beljonne, D., Coropceanu, V., Cornil, J., Chem. Rev. 104, 4971 (2004).CrossRefGoogle Scholar
Facchetti, A., Beverina, L., van der Boom, M.E., Dutta, E.G., Pagani, G.A., Marks, T.J.J., Am. Chem. Soc. 128, 2142 (2006).CrossRefGoogle Scholar
Brédas, J.L., Street, G.B., Thémans, B., André, J.M., J. Chem. Phys. 83, 1323 (1985).CrossRefGoogle Scholar
Roncali, J., Chem. Rev. 97, 173 (1997).CrossRefGoogle Scholar
a) Salzner, U., Lagowski, J.B., Pickup, P.G., Poirier, R.A., J. Org. Chem. 64, 7419 (1999). b) R. Salcedo, J. Mol. Model. 13, 1027 (2007).CrossRefGoogle Scholar
Salzner, U., Synth. Metal. 101, 482 (1999).CrossRefGoogle Scholar
Schulte, K.E., Reisch, J., Walker, H., Chem. Ber. 98, 98(1965).CrossRefGoogle Scholar
Huerta, G., Fomina, L., Rumsh, L., Zolotukhin, M.G., Polymer Bulletin 57, 433 (2006).CrossRefGoogle Scholar
Dirlikov, S., Chen, Z., Wang, D., Polymer 34, 705 (1993).CrossRefGoogle Scholar
Becke, A.D., Phys. Rev. 38, 3098 (1988).CrossRefGoogle Scholar
Perdew, J.P., Wang, Y., Phys. Rev. B 45, 13244 (1992).CrossRefGoogle Scholar
a). Wu, C.J., Yang, L.H., Fried, L.E., Quenneville, J., Martinez, T.J., Phys. Rev. B 67, Art. No. 235101 (2003). b). Ch.W. Bauschlicher, J.W. Lawson, A. Ricca, Y.Xue, M.A. Ratner, Chem Phys. Lett. 388, 427 (2004). CrossRefGoogle Scholar
Frisch, M.J., Trucks, G.W., Schlegel, H.B., Scuseira, G.E., Robb, M.A., Cheeseman, J.R., Zakrzewski, V.G. Jr. Montgomery, J.A., Stratmann, R.E., Burant, J.C., Dapprich, S., Millam, J.M., Daniels, A.D., Kudin, K.N., Strain, M.C., Farkas, O., Tomasi, J., Barone, V., Cossi, M., Cammi, R., Menucci, B., Pomelli, C., Adamo, C., Clifford, S., Ochterski, J., Petersson, G.A., Ayala, P.Y., Morokuma, K., Malick, D.K., Rabuck, A.D., Raghavachari, K., Foresman, J.B., Cioslowski, J., Ortiz, J.V., Stefanov, B.B., Liu, G., Liashenko, A., Piskorz, P., Komaromi, I., Gomperts, R., Martin, L.R., Fox, D.J., Keith, T., Al-Laham, M.A., Peng, C.Y., Nanayakkara, A., Gonzalez, C., Challacombe, M., Gill, P.M.W., Johnson, B.G., Chen, W., Wong, M.W., Andres, J.L., Head-Gordon, M., Replogle, E.S., Pople, J.A., Gaussian98, Gaussian Inc., Pittsburgh, PA (1998).Google Scholar
a) Krygowski, T.M., J. Chem. Inf. Comput. Sci. 33, 70 (1993). b) J. Kruszewski, T.M. Krygowski, Tetrahedron Lett. 1972, 3839 (1972). c). T.M. Krygowski, R. Anulewicz, Kruszewski, J. Acta Cryst. B 39, 732 (1983). d) T.M. Krygowski, M.K. Cyranskinski, Chem. Rev. 101, 1385 (2001).CrossRefGoogle Scholar
Chalk, A.J., Tetrahedron 30, 1387 (1974).CrossRefGoogle Scholar