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Scaling Challenges for NAND and Replacement Memory Technology
Published online by Cambridge University Press: 08 July 2011
Abstract
Planar NAND technology is rapidly approaching its fundamental limits and will likely transition to a three dimensional structure. The scaling challenges facing NAND will be reviewed. Emerging memory technologies, such as the cross-point, will be discussed. The materials challenges facing emerging memories will be reviewed.
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- Research Article
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- Copyright © Materials Research Society 2011
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