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Plasma Assisted Chemical Vapor Deposition of Aluminum For Metallization In Ulsi

Published online by Cambridge University Press:  15 February 2011

Dong-Chan Kim ,
Young-Soung Kim  and
Seung-Ki Joo
Dong-Chan Kim
Affiliation:
Dept. of Metall. Eng., Seoul National University, [email protected] 56-1, Shillim-dong, Kwanak-ku, Seoul, 151-742, Korea
Young-Soung Kim
Affiliation:
Dept. of Metall. Eng., Seoul National University, [email protected] 56-1, Shillim-dong, Kwanak-ku, Seoul, 151-742, Korea
Seung-Ki Joo
Affiliation:
Dept. of Metall. Eng., Seoul National University, [email protected] 56-1, Shillim-dong, Kwanak-ku, Seoul, 151-742, Korea
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Abstract

An aluminum thin film for ultra large scale integrated circuits(ULSI) metalization has been formed by PACVD using DMEAA(Dimethylethylamine alane) as a precursor. The selectivity was lost but the conformal step coverage was still maintained when the hydrogen plasma was added to conventional CVD process so that perfectly planarized metalization could be obtained.

Comparing to thermal CVD, the reflectivity as well as the resistivity could be much improved especially when the film was deposited on SiO2. The deposition rate and the resistivity of PACVD Al thin films deposited on various substrates such as Si, TiN and SiO2 were compared with those of thermal CVD Al thin films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 427: Symposium K – Advanced Metallization for Future ULSI , 1996 , 283
Copyright
Copyright © Materials Research Society 1996

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