Hostname: page-component-f554764f5-c4bhq Total loading time: 0 Render date: 2025-04-11T07:27:49.239Z Has data issue: false hasContentIssue false
  • English
  • Français

Optical Properties of Materials using the Empirical Tight-Binding Method

Published online by Cambridge University Press:  10 February 2011

L. C. Lew Yan Voon
L. C. Lew Yan Voon*
Affiliation:
Department of Physics, Worcester Polytechnic Institute, 100 Institute Road, Worcester, Massachusetts 01609
Get access

Abstract

Procedures for calculating the optical properties of periodic systems using the empirical tight-binding method are compared. Results of the linear and nonlinear susceptibilities are presented using a recently developed exact formalism [Lew Yan Voon and Ram-Mohan. Phys. Rev. B47, 15500 (1993)].

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 491: Symposium R – Tight Binding Approach to Computational Materials Science , 1997 , 377
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

[1] Slater, J. C. and Koster, G. F., Phys. Rev. 94, 1498 (1954).Google Scholar
[2] Xu, Z., Solid State Commun. 76, 1143 (1990).Google Scholar
[3] Chang, Y. C. and Aspnes, D. E., Phys. Rev. B 41, 12002 (1990).Google Scholar
[4] Lew Yan Voon, L. C. and Ram-Mohan, L. R., Phys. Rev. B 47, 15500 (1993).Google Scholar
[5] Lew Yan Voon, L. C. and Ram-Mohan, L. R., Phys. Rev. B 50, 14421 (1994).Google Scholar
[6] Vogl, P., Hjalmarson, H. P., and Dow, J. D., J. Phys. Chem. Solids 44, 365 (1983).Google Scholar
[7] Schulman, J. N. and Chang, Y. C., Phys. Rev. B 31, 2056 (1985).Google Scholar
[8] Lu, Y.-T. and Sham, L. J., Phys. Rev. B 40, 5567 (1989).Google Scholar
[9] Gorczyca, I., Pfeffer, P., and Zawadzki, W., Semicond. Sci. Technol. 6, 963 (1991).Google Scholar
[10] Graf, M. and Vogl, P., Phys. Rev. B 51, 4940 (1995).Google Scholar
[11] Cohen, M. L. and Chelikowsky, J. R., Electronic Structure and Optical Properties of Semiconductors (Springer-Verlag, Berlin, 1988).Google Scholar