Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-27T02:23:25.907Z Has data issue: false hasContentIssue false

The Nucleation and Growth of GaAs on Si

Published online by Cambridge University Press:  28 February 2011

J. S. Harris Jr.
Affiliation:
Stanford University, Department of Electrical Engineering, Mccullough 208, Stanford, CA
S. M. Koch
Affiliation:
Stanford University, Department of Electrical Engineering, Mccullough 208, Stanford, CA
S. J. Rosner
Affiliation:
Stanford University, Department of Electrical Engineering, Mccullough 208, Stanford, CA also with Hewlett-Packard Circuit Technology Group, Deer Creek Road, Palo Alto, CA 94306
Get access

Abstract

Substantial progress has been realized in both understanding the nucleation and growth of GaAs/Si and demonstration of device application of this technology. In this paper, we review the recent progress in the role of the Si surface, initial nucleation, the GaAs/Si interface, GaAs thick layer growth and defect generation and control in the GaAs layer. This last area is the remaining area where substantial progress is still required. Several new approaches for defect control are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Yeh, Y. C. M., Wang, K. L., Shin, B. K. and Stirn, R. J., Fourteenth IEEE Photovoltaic Specialists Conf, 1980, p. 1338–1342.Google Scholar
2. Stirn, R. J., Wang, K. L. and Yeh, Y. C. M., Fifteenth IEEE Photovoltaic Specialists Conf., 1981, p. 1045–1050.Google Scholar
3. Fan, J. C. C., Turner, G. W., Gale, R. P. and Bozler, C. O., Fourteenth IEEE Photovoltaic Specialists Conf, 1980, p. 1102–1106.Google Scholar
4. Fan, J. C. C., Bozler, C. O. and Palm, B. J., Appl. Phys. Lett. 35, 875 (1979).Google Scholar
5. Gale, R. P., Tsaur, B. Y., Fan, J. C. C., Davis, F. M. and Turner, G. W., Fifteenth IEEE Photovoltaic Specialists Conf., 1981, p. 1051–1055.Google Scholar
6. Pande, K. P., Reep, D. H., Shastry, S. K., Weiner, A. S., Borego, J. M., and Ghandhi, S. K., Fourteenth IEEE Photovoltaic Specialists Conf., 1980, p. 1324–1329.Google Scholar
7. Dapkus, P. D., Dupuis, R. D., Yingling, R. D., Yang, J. J., Simpson, W. I., Moudy, L. A., Johnson, R. E., Campbell, A. G., Manasevit, H. M. and Ruth, R. P., Thirteenth IEEE Photovoltaic Specialists Conf., 1978, p. 960–965.Google Scholar
8. Miller, D. L., Cohen, M. J. and Harris, J. S., Final SERI Report, Development of Polycrystal GaAs Solar Cells, Contract XS-9-8032-1, 1981.Google Scholar
9. Yang, H. T., Miller, D. L., Shen, Y. D., Edwall, D. D. and Harris, J. S., Fourteenth IEEE Photovoltaic Specialists Conf., 1980, p. 1333–1337.Google Scholar
10. Chu, S. S., Chu, T. L., Lee, Y. T., Jiang, C. L. and Kuper, A. B., Fourteenth IEEE Photovoltaic Specialists Conf., 1980, p. 1306–1310.Google Scholar
11. Chu, S. S., Chu, T. L., Jiang, C. L., Loh, C. W., Stokes, E. D. and Yu, J. M., Fifteenth IEEE Photovoltaic Specialists Conf., 1981, p. 1310–1315.Google Scholar
12. Tsaur, B. Y., Fan, J. C. C., Turner, G. W., Davis, F. M. and Gale, R. P., Sixteenth IEEE Photovoltaic Specialists Conf., 1982, p. 1143–1148.Google Scholar
13. Miller, D. L. and Harris, J. S., Appl. Phys. Lett. 37, 1104 (1980).Google Scholar
14. Fan, J. C. C., Bozler, C. O. and Palm, B. J., Appl. Phys. Lett. 35, 875 (1979).Google Scholar
15. Wright, S. L. and Kroemer, H., Appl. Phys. Lett. 37, 210 (1980).Google Scholar
16. Ishizaka, A., Nakagawa, K. and Shiraki, Y., Proc 2nd Intern. Symp. MBE/CST, Tokyo, 1982, p. 183–185.Google Scholar
18. Gale, R. P., Tsaur, B. Y., Fan, J. C. C., Davis, F. M. and Turner, G. W., Proc. Fifteenth Photovoltaic Specialists Conf., 1981, p. 1051–1055.Google Scholar
19. Masselink, W. T., Henderson, T., Klem, J., Fischer, R., Rearah, P., Morkog, H., Hafich, M., Wang, P. D. and Robinson, G. Y., Appl. Phys. Lett., 45 1309 (1984).Google Scholar
20. Shaw, D. W., Mater. Res. Soc. Symp. Proc., this volume (1987).Google Scholar
21. Becker, G. E. and Bean, J. C., J. Appl. Phys., 48, 3395 (1977).Google Scholar
22. Ota, Y., J. Electrochem. Soc., 124, 1795 (1977).Google Scholar
23. Xie, Y. H., Wu, Y. Y. and Wang, K. L., Proc. 1st Intern. Symp. on Silicon Molecular Beam Epitaxy, Ed. Bean, J. C., Vol. PV 85–7 (Electrochem. Soc., Pennington, NJ, 1985) p. 93.Google Scholar
24. Xie, Y. H., Wu, Y. Y. and Wang, K. L., AppL. Phys. Lett. 48, 287 (1986).Google Scholar
25. Xie, Y. H., PhD Thesis, Dept. of Electrical Engineering, University of California at Los Angeles (1986).Google Scholar
26. Tabe, M., Appl. Phys. Left. 45, 1073 (1984).Google Scholar
27. Biegelsen, D. K., Krusor, B. and Yingling, R. D., private communication, 1987.Google Scholar
28. Kroemer, H., Polasko, K. J. and Wright, S. L., Appl. Phys. Left., 36, 763 (1980).Google Scholar
29. Neave, J. H., Larsen, P. K., Joyce, B. A., Gowers, J. P. and van der Veen, J. F., J. Vac. Sci. Technol., B1, 668 (1983).Google Scholar
30. Bringans, R. D., Olmstead, M. A., Uhrberg, R.I.G. and Bachrach, R.Z., in Proc. 18th Intern. Conf. on the Physics of Semiconductors Stockholm 1986.Google Scholar
31. Sakamoto, T. and Hashiguchi, G., Japan. J. Appl. Phys., 25, L57 (1986).Google Scholar
32. Henzler, M. and Clabes, J., in Proc. 2nd Intern. Conf. on Solid Surfaces, Kyoto, 1974 [Japan. J. Appl. Phys. Suppl. 2, Part 2, 389 (1974)].Google Scholar
33. Kaplan, R., Surface Sci., 93, 145 (1980).Google Scholar
34. Aspnes, D. E. and Ihm, J., Phys. Rev. Left., 57, 3054 (1986).Google Scholar
35. Hull, R., Fischer-Colbrie, A., Rosner, S. J., Koch, S.M. and Harris, J. S. Jr., Mater. Res. Soc. Symp. Proc., this volume (1987).Google Scholar
36. Wright, S. L., Inada, M. and Kroemer, H., J. Vacuum Sci. Technol., 21, 534 (1982).Google Scholar
37. Wright, S. L., Kroemer, H. and Inada, M., J. Appl. Phys., 55, 2916 (1984).Google Scholar
38. Uppal, P. N. and roemer, HIK., J. Appl. Phys., 58, 2195 (1985).Google Scholar
39. Kroemer, H., J. Crystal Growth, 81, 193 (1987).Google Scholar
40. Biegelsen, D. K., private communication, 1986.Google Scholar
41. Fischer, R., Morkoq, J., Neumann, D.A., Zabel, H., Choi, C., Otsuka, N., Longerbone, M. and Erickson, L. P., J. Appl. Phys., 60, 1640 (1986).Google Scholar
42. Pukite, P. R., Cohen, P. I., Appl. Phys. Left., 50, 1739 (1987).Google Scholar
43. Rosner, S. J., Koch, S. M., Harris, J.S. Jr., Mater. Res. Soc. Symp. Proc., this volume (1987).Google Scholar
44. Inoue, N., Tanishiro, Y., Yagi, K., Jap. J. Appl. Phys., 26, L293 (1987).Google Scholar
45. Akiyama, M., Kawarada, Y., Nishi, S., Ueda, T. and Kaminishi, K., Mater. Res. Soc. Symp. Proc., Vol. 67, 53 (1986).Google Scholar
46. Sakai, S., Soga, T., Takeyasu, M. and Umeno, M., Mater. Res. Soc. Symp. Proc., Vol. 67, 15 (1986).Google Scholar
47. Rosner, S.J., Koch, S.M., Harris, J.S. Jr., Appl. Phys. Lett., 49, 1764 (1986).Google Scholar
48. Koch, S. M., Rosner, S. J., Hull, R., Yoffe, G. W. and Harris, J. S. Jr., J. Crystal Growth, 81, 205 (1987).Google Scholar
49. Uhrberg, R. I. G., Bringans, R. D., Bachrach, R. Z., Northrup, J. E., J. Vac. Sci. Technol., A 4, 1259 (1986).Google Scholar
50. Lee, J. W., Mater. Res. Soc. Symp. Proc., Vol. 67, 29 (1986).Google Scholar
51. Hull, R., Rosner, S. J., Koch, S. M., Harris, J. S. Jr., Appl. Phys. Lett., 49, 1714 (1986).Google Scholar
52. Ponce, F., Anderson, G. and Biegelsen, D., Proc. Fourteenth Intern. Conf. on Defects in Semiconductors Paris 1986).Google Scholar
53. van der Ziel, J. P., Dupuis, R. D., Logan, R. A., Milulyak, R. M., Pinzone, C. J. and Savage, A., Appl. Phys. Lett., 50, 454 (1987).Google Scholar
54. Kaliski, R. W., Holonyak, N. Jr., Hsieh, K. C., Nam, D. W., Lee, J. W., Shichijo, H., Burnham, R. D., Epler, J. E. and Chung, H. F., App. Phys. Lett. 50, 836 (1987).Google Scholar
55. Nam, D. W., Holonyak, N. Jr., Hsieh, K. C., Kaliski, R. W., Lee, J. W., Shichijo, H., Epler, J. E., Burnham, R. D. and Pooli, T. L., to be published in Appl. Phys. Lett. (1987).Google Scholar
56. Morkoç, H., private communcation.Google Scholar
57. Nauka, K., Reid, G. A., Rosner, S. J., Koch, S. M. and Harris, J. S., Mater. Res. Soc. Symp. Proc., this volume (1987).Google Scholar
58. Bedair, S. M., Humphries, T. P., EI-Masry, N. A., Lo, Y., Hamaguchi, N., Lamp, C. D., Tuttle, A. A., Deifus, D. L. and Russell, P., Appl. Phys. Lett., 49, 942 (1986).Google Scholar
59. Dupuis, R. D., Bean, J. C., Brown, J. M., Macrander, A. T., Miller, R. C. and Hopkins, L. C., J. Elect. Matls., 16, 69 (1987).Google Scholar
60. Luryi, S. and Sze, S. M., “Possible Device Applications of Si MBE,” in Silicon Molecular Beam Epitaxy, ed. by Kasper, E. and Bean, J. C. (CRC Press, Cleveland, OH, 1986).Google Scholar
61. Zogg, H., Appl. Phys. Lett., 49, 933 (1986).Google Scholar
62. Lee, J. W., Shichijo, H., Tsai, J. L. and Matyi, R. J., Appl. Phys. Lett., 50, 31 (1987).Google Scholar
63. Chand, N., People, R., Baiocchi, F. A., Wecht, K. W. and Cho, A. Y., Appl. Phys. Lett., 49, 815 (1986).Google Scholar