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Luminescence Properties of Thin-Film SrS:Cu Phosphors for Electroluminescent Displays

Published online by Cambridge University Press:  10 February 2011

T.C. Jones
Affiliation:
Phosphor Technology Center of Excellence, Georgia Institute of Technology, Atlanta, Georgia, 30332, [email protected]
W. Park
Affiliation:
Phosphor Technology Center of Excellence, Georgia Institute of Technology, Atlanta, Georgia, 30332, [email protected]
E. Mohammed
Affiliation:
Phosphor Technology Center of Excellence, Georgia Institute of Technology, Atlanta, Georgia, 30332, [email protected]
B.K. Wagner
Affiliation:
Phosphor Technology Center of Excellence, Georgia Institute of Technology, Atlanta, Georgia, 30332, [email protected]
C.J. Summers
Affiliation:
Phosphor Technology Center of Excellence, Georgia Institute of Technology, Atlanta, Georgia, 30332, [email protected]
S.S. Sun
Affiliation:
Planar America Inc., Beaverton, Oregon, 97006
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Abstract

The origin of the electronic fine structure in thin-film SrS:Cu has been interpreted in terms of the several possible perturbations including spin-obit coupling, the Jahn-Teller effect and low symmetry splittings. Photoluminescence excitation measurements showed that the peak position of the excitation bands were independent of temperature suggesting that the electronic fine structure in our system was not due to the Jahn-Teller effect. Selective excitation measurements revealed that no peak shift occurs with changing excitation wavelength, indicating that Cu+ pairs or aggregates and Cu+-defect coupled centers were not existent in our system. Finally, several models were proposed for off-center displacements of Cu in SrS, since a rigorous treatment of these displacements is difficult. Both the tetragonal and trigonal distortion models for a <111> displacement yielded reasonable distortions parameters of 0. 16Å and 0.11Å, respectively. However, crystal field analysis showed that a <110> displacement was more likely since the energy level splitting scheme more closely resembled the observed data.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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