Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-05T21:38:21.309Z Has data issue: false hasContentIssue false

Hydrothermal Synthesis and Characterization of ThO2, UxTh1-xO2, and UOx

Published online by Cambridge University Press:  14 August 2013

Jacob Castilow
Affiliation:
Air Force Institute of Technology, Wright Patterson AFB, OH, United States. Oak Ridge Institute for Science and Education, Oak Ridge, TN, United States.
Timothy W Zens
Affiliation:
Air Force Institute of Technology, Wright Patterson AFB, OH, United States.
J. Matthew Mann
Affiliation:
Air Force Research Laboratory, Sensors Directorate, Wright Patterson AFB, OH, United States.
Joseph W. Kolis
Affiliation:
Center for Optical Materials Science and Engineering Technologies and Department of Chemistry, Clemson University, Clemson, SC United States.
Colin D. McMillen
Affiliation:
Center for Optical Materials Science and Engineering Technologies and Department of Chemistry, Clemson University, Clemson, SC United States.
James Petrosky
Affiliation:
Air Force Institute of Technology, Wright Patterson AFB, OH, United States.
Get access

Abstract

Hydrothermal synthesis of ThO2, UxTh1-xO2, and UOx at temperatures between 670°C and 700°C has been demonstrated. Synthesis at these temperatures is 50-80°C below prior growth studies and represents a new lower bound of successful growth. ThO2 single crystals of dimensions 6.49mm x 4.89mm x 3.89 mm and weighing 0.633g have been synthesized at average growth rates near 0.125mm/week. Single crystal UxTh1-xO2 crystals with mole fractions up to x≈0.30 have also been grown. The largest alloyed crystal with mole fraction x≈0.23 has dimensions of 2.97mm x 3.23mm x ∼3mm and recorded average growth rates near 0.2mm/week. Four structures were solved from X-ray diffraction data and their crystallographic data reported here. Rocking curve analysis determined a dislocation density of 1.2×109 cm-2.

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Hussein, E. M., Handbook on Radiation Probing, Gauging, Imaging and Analysis: Volume I Basics and Techniques (Google eBook). Springer, 2003, p. 464.CrossRefGoogle Scholar
Choppin, G., RYDBERG, J., and Liljenzin, J.-O., Radiochemistry and Nuclear Chemistry (Google eBook). Butterworth-Heinemann, 2001, p. 720.Google Scholar
Reilly, D., Ensslin, N., Smith, H. J., and Kreiner, S., “Passive nondestructive assay of nuclear materials, ” Mar. 1991.Google Scholar
L’Annuziata, M. F., Ed., Handbook of Radioactivity Analysis (Google eBook). Academic Press, 2012, p. 1418.Google Scholar
Boyes, W., Ed., Instrumentation Reference Book (Google eBook), vol. 2009. Butterworth-Heinemann, 2009, p. 928.Google Scholar
Shultis, J. K. and Faw, R. E., Fundamentals of Nuclear Science and Engineering Second Edition, vol. 2007. Taylor & Francis, 2007, p. 616.Google Scholar
Tsoulfanidis, N., , Ph.D., and Landsberger, S., Measurement and Detection of Radiation. CRC Press, 2011, p. 493.Google Scholar
Bates, J. L., et al. , Irradiation effects in uranium dioxide single crystal. Hanford Atomic Products Operation, 1962, p. 28.Google Scholar
Springer Handbook of Crystal Growth (Google eBook). Springer, 2010, p. 1816.Google Scholar
Ervin, G. and Osborn, E. F., J. Geol., vol. 59, p. p.381, 1951.CrossRefGoogle Scholar
Shafer, M. W. and Roy, R., Z. Anorg. Allg. Chemistry, vol. 276, no. 275, 1954.CrossRefGoogle Scholar
Shafer, M. W. and Roy, R., J. Am. Ceram. Soc., vol. 42, p. 563, 1959.CrossRefGoogle Scholar
McMillen, C. and Kolis, J., “Bulk single crystal growth from hydrothermal solutions,” Philosophical Magazine, no. June, pp. 37–41, 2012.Google Scholar
Mann, M., Kolis, J., et al. “Hydrothermal Growth and Thermal Property Characterization of ThO2 Single Crystals,” Crystal Growth & Design, vol. 10, no. 5, pp. 21462151, May 2010.CrossRefGoogle Scholar
Heinhold, R., et al. , “Optical and defect properties of hydrothermal ZnO with low lithium contamination,” Applied Physics Letters, vol. 101, no. 6, p. 062105, Aug. 2012.CrossRefGoogle Scholar
Tsukazaki, A., et al. , “Blue Light-Emitting Diode Based on ZnO,” Japanese Journal of Applied Physics, vol. 44, no. No. 21, pp. L643L645, May 2005.CrossRefGoogle Scholar
Laudise, R. A., et al. , “Hydrothermal Growth of Large Sound Crystals of Zinc Oxide,” Journal of the American Ceramic Society, vol. 47, no. 1, pp. 912, Jan. 1964.CrossRefGoogle Scholar
Janotti, A. and Van de Walle, C. G., “Fundamentals of zinc oxide as a semiconductor,” Reports on Progress in Physics, vol. 72, no. 12, p. 126501, Dec. 2009.CrossRefGoogle Scholar
“SPOT ADVANCED.” Diagnostic Instruments Inc., 1997.Google Scholar
“Crystal Clear Mercury CCD Automated Imaging System.” Rigaku Corp., Oren UT, 2001.Google Scholar
Sheldrick, G. M., “SHELXTL Program for Crystal Structure Refinement.” University of Gottingen, Germany, 2000.Google Scholar