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Hardness and Elastic Modulus Measurements in CdTe and ZnTe Thin Film and Bulk Samples and ZnTe-CdTe Superlattices

Published online by Cambridge University Press:  22 February 2011

L. J. Farthing ,
T. P. Weihs ,
D. W. Kisker ,
J. J. Krajewski ,
M. F. Tang  and
D. A. Stevenson
L. J. Farthing
Affiliation:
Department of Materials Science, Stanford University, Stanford, California 94305
T. P. Weihs
Affiliation:
Department of Materials Science, Stanford University, Stanford, California 94305
D. W. Kisker
Affiliation:
AT&T Bell Laboratories, Homdel, New Jersey 07733
J. J. Krajewski
Affiliation:
AT&T Bell Laboratories, Homdel, New Jersey 07733
M. F. Tang
Affiliation:
Department of Materials Science, Stanford University, Stanford, California 94305
D. A. Stevenson
Affiliation:
Department of Materials Science, Stanford University, Stanford, California 94305
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Abstract

Hardness and modulus values of bulk and epilayer ZnTe and CdTe samples and of ZnTe-CdTe superlattices are reported. Both hardness and Young's modulus values increase with increasing ZnTe content in the ZnCdTe samples. Alloying effects and strains in the superlattice structure are proposed to explain the strengthening.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 130: Symposium C – Thin Films: Stresses and Mechanical Properties I , 1988 , 123
Copyright
Copyright © Materials Research Society 1989

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References

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