Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-09T09:20:29.405Z Has data issue: false hasContentIssue false

GaN Electrochemical Probes and MEMS on Si

Published online by Cambridge University Press:  01 February 2011

Ulrich Heinle
Affiliation:
[email protected], MicroGaN GmbH, R&D, Albert-Einstein-Allee 45, Ulm, 89081, Germany, +497315026190, +497315026155
Peter Benkart
Affiliation:
[email protected], MicroGaN GmbH, Albert-Einstein-Allee 45, Ulm, 89081, Germany
Ingo Daumiller
Affiliation:
[email protected], MicroGaN GmbH, Lise-Meitner-Strasse 13, Ulm, 89081, Germany
Mike Kunze
Affiliation:
[email protected], MicroGaN GmbH, Lise-Meitner-Strasse 13, Ulm, 89081, Germany
Ertugrul Sönmez
Affiliation:
[email protected], MicroGaN GmbH, Lise-Meitner-Strasse 13, Ulm, 89081, Germany
Get access

Abstract

AlGaN /GaN HEMT structures were used for liquid and gas sensors. The sensitivity of pH sensors was determined after clean-in-place tests. A multigas measurement at 330°C is presented. A piezo-driven mechanical actor is demonstrated and used as a variable capacitor. GaN on silicon logic circuitry is demonstrated at 250°C.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Steinhoff, G. Herrmann, M. Schaff, W. J. Eastman, L. F. Stutzmann, M. and Eickhoff, M. Appl. Phys. Lett. 83, 177 (2003).Google Scholar
2. Lundström, I., Shivaraman, M. S. Svensson, C. Lundkvist, I. Appl. Phys. Lett. 26 5557 (1975).Google Scholar
3. Schalwig, J. Müller, G., Ambacher, O. Stutzmann, M. Phys. Stat. Sol. (Part A) 1851 3945 (2001).Google Scholar
4. Krost, A. and Dadgar, A. Phys. Stat. Sol. A 194, no. 2, 361375, (2002).Google Scholar
5. Kang, B. S. Kim, J. Jang, S. Ren, F. Johnson, J. W. Therrien, R. J. Rajagopal, P. Roberts, J. C. Piner, E. L. Linthicum, K. J. Chu, S. N. G. Baik, K. Gila, B. P. Abernathy, C. R. and Pearton, S. J. Appl. Phys. Lett. 86, no. 25, (2005).Google Scholar
6. Zimmermann, T. Neuburger, M. Benkart, P. Hernàndez-Guillén, F. J., Pietzka, C. Kunze Daumiller, M., Dadgar, A. Krost, A. and Kohn, E. IEEE Electron Device Letters 27, no. 5, (2006).Google Scholar
7. Tuyl, R. L. van and Liechti, C. A. IEEE Journal of Solid-State Circuits 9, no. 5, 269276, (1974).Google Scholar
8. Tuyl, R. L. van and Liechti, R. Lee and Gowen, E. IEEE Journal of Solid-State Circuits 12, no. 5, 485495, (1977).Google Scholar