Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-04T21:26:39.309Z Has data issue: false hasContentIssue false
  • English
  • Français

Epitaxial Growth and Characterization of Lattice-Matched MgO/Cr0.7Mo0.3/MgO(001) Layered Structures

Published online by Cambridge University Press:  15 February 2011

S.A. Chambers ,
Y. Liang  and
Y. Gao
S.A. Chambers
Affiliation:
Environmental Molecular Sciences Laboratory Pacific Northwest laboratory Richland, Washington
Y. Liang
Affiliation:
Environmental Molecular Sciences Laboratory Pacific Northwest laboratory Richland, Washington
Y. Gao
Affiliation:
Environmental Molecular Sciences Laboratory Pacific Northwest laboratory Richland, Washington
Get access

Abstract

We have grown by molecular beam epitaxy (MBE) structurally coherent layers of MgO and a random bcc alloy of 70% Cr and 30% Mo to which MgO is lattice matched. Specimens werecharacterized by means of reflection high-energy electron diffraction (RHEED), x-ray photoelectron spectroscopy and diffraction (XPS/XPD), transmission electron microscopy (TEM), and atomic force microscopy (AFM). These systems exhibit excellent long- and shortrange crystallographic order, as well as nearly perfect structural coherence across the interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 357: Symposium C – Structure and Properties of Interfaces in Ceramics , 1994 , 183
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chambers, S.A., Tran, T.T., Hileman, T.A., and Jurgens, T.A., Surf. Sci. 320, L81 (1994).Google Scholar
2. Peden, C.H.F., Kidd, K.B., and Shinn, N.D., J. Vac. Sci. Technol. A 9, 1518 (1991).Google Scholar
3. Trzebiatowski, W., Ploszek, H., and Lobzowski, J., Anal. Chem. 19, 93 (1947).Google Scholar
4. Chambers, S.A., Tran, T.T., and Hileman, T.A., J. Mat. Res., in press (1994).Google Scholar
5. Chambers, S.A., Tran, T.T., and Hileman, T.A., J. Vac. Sci. Technol., in press (1995).Google Scholar
6. Herman, G.S. and Fadley, C.S., private communication.Google Scholar
7. Fadley, C.S., in Synchrotron Radiation Research: Advances in Surface and Interface Science, Volume 1: Techniques, edited by Bachrach, R.Z., Plenum Press, New York (1992)Google Scholar
8. Chambers, S.A., Adv. in Phys. 40, 357 (1991).Google Scholar
9. Egellhoff, W.F. Jr., Crit. Rev. Solid St. Mat. Sci. 16, 213 (1990).Google Scholar
10. Chambers, S.A. and Tran, T.T., Surf. Sci. 314, L867 (1994).Google Scholar
11. Perrot, E., Dayez, M., Humbert, A., Marti, O., Chapon, C., and Henry, C.R., Europhys. Lett. 26, 659 (1994).Google Scholar
12. Trampert, A., Ernst, F., Flynn, C.P., Fischmeister, H.F., and Ruhle, M., Act. Metall. Mater. 40, S227 (1992).Google Scholar