Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-29T07:40:16.670Z Has data issue: false hasContentIssue false

Electrophoretic Deposition of Sol-Gel-Derived Ceramic Coatings

Published online by Cambridge University Press:  25 February 2011

Yining Zhang
Affiliation:
Department of Chemistry and UNM/NSF Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, NM.
C. Jeffrey Brinker
Affiliation:
Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, NM, and Sandia National Laboratories, Albuquerque, NM.
Richard M. Crooks
Affiliation:
Department of Chemistry and UNM/NSF Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, NM.
Get access

Abstract

The physical, optical, and chemical characteristics of electrophoretically- and dip-coated sol-gel ceramic films are compared. The results indicate that electrophoresis may allow a higher level of control over the chemistry and structure of ceramic coatings than dip-coating techniques. For example, controlled-thickness sol-gel coatings can be prepared by adjusting the deposition time or voltage. Additionally, electrophoretic coatings prepared in a four-component alumino-borosilicate sol display interesting optical characteristics. For example, the ellipsometrically-measured refractive indices of electrophoretic coatings are higher than the refractive indices of dip-coated films cast from identical sols, and they are also higher than any of the individual sol components. This result suggests that there are physical and/or chemical differences between films prepared by dip-coating and electrophoresis.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Gutierrez, C., Mosley, J., and Wallace, T., J. Electrochem. Soc. 109, 923 (1962).CrossRefGoogle Scholar
2. Foss, C. L., M. S. Thesis, Massachusetts Institute of Technology, Sept. 1982.Google Scholar
3. Dalzell, W. J. and Clark, D. E., Ceram. Eng. Sci. Proc. 7, 1014 (1986).Google Scholar
4. Clark, D. E., Dalzell, W. J. and Folz, D. C., Ceram. Eng. Sci. Proc. 9, 1111 (1988).Google Scholar
5. Scriven, L. E. in Better Ceramics Through Chemistry III edited by Brinker, C. J., Clark, D. E., and Ulrich, D. R. (Mat. Res. Soc., Pittsburgh, Pa., 1988), p. 717.Google Scholar
6. Dalzell, W. J. Jr, M. S. Thesis, The University of Florida, 1988.Google Scholar
7. Ellipsometric measurements were made using a Rudolf 43603–200E manual ellipsometer configured with a He-Ne laser at a 70° angle of incidence and a 45°/135° azimuth of the quarter-wave compensator. The complex refractive index of a naked Au substrate measured prior to coating, and an algorithm developed at Sandia National Laboratories were used to calculate film thicknesses and refractive indices (Tardy, H. L. “ELLIPSE User's Manual and Program Reference”; Report No. 89–0008; Sandia National Laboratories:Albuquerque, NM).Google Scholar
8. CRC Handbook of Chemistry and Phvsics edited by Lide, D. R. (CRC Press, Inc.), 71th Edition 19901991.Google Scholar
9. Brinker, C. J. and Scherer, G.W., Sol-Gel Science (Academic Press, INC. San Diego, CA 1990) p. 357.Google Scholar
10. Sussman, A. and Ward, T. J., RCA Review, 42, 178 (1981).Google Scholar