Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-27T01:47:27.305Z Has data issue: false hasContentIssue false
  • English
  • Français

Dependence of the Elastic Moduli of Skutterudites on Density and Temperature

Published online by Cambridge University Press:  22 June 2011

G. Rogl ,
S. Puchegger ,
M. Zehetbauer ,
A. Grytsiv  and
P. Rogl
G. Rogl
Affiliation:
Institute of Physical Chemistry, University Vienna, Währingerstr. 42, A-1090 Wien, Austria Faculty of Physics, Physics of Nanostructured Materials, University Vienna, Boltzmanngasse 5, A-1090 Wien, Austria
S. Puchegger
Affiliation:
Faculty of Physics, University Vienna, Boltzmanngasse 5, A-1090 Wien, Austria
M. Zehetbauer
Affiliation:
Faculty of Physics, Physics of Nanostructured Materials, University Vienna, Boltzmanngasse 5, A-1090 Wien, Austria
A. Grytsiv
Affiliation:
Institute of Physical Chemistry, University Vienna, Währingerstr. 42, A-1090 Wien, Austria
P. Rogl
Affiliation:
Institute of Physical Chemistry, University Vienna, Währingerstr. 42, A-1090 Wien, Austria
Get access

Abstract

The dependency of Young’s and shear modulus on relative density and temperature was determined for three series of skutterudites: p-type MmyFe3CoSb12 (y = 0.70, 0.80), p-type DDyFe3CoSb12 (y = 0.65, 0.68) and n-type Sr0.07Ba0.07Yb0.07Co4Sb12. For all three groups of materials the dependency of Young’s modulus, E, on the density and temperature is linear: E(d) = 4.1(1)×d – 268(3) GPa (d is the relative density in %), ΔE/ΔT = 0.20(1) GPa/K, thus allowing extrapolation of E as a function of temperature and towards 100% density.

Keywords

elastic propertiesthermoelectricnanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1325: Symposium E – Energy Harvesting—Recent Advances in Materials, Devices and Applications , 2011 , mrss11-1325-e03-13
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Sales, B.C, Mandrus, D. and Williams, R.K., Science 272 1325–8 (1996).Google Scholar
2. Keppens, V., Mandrus, D., Sales, B. C., Chakoumakos, B. C., Dai, P., Coldea, R., Maple, M. B., Gajewski, D. A., Freeman, E. J., Bennington, S., Nature 395, 876–878 (1998).Google Scholar
3. Nolas, G., Morelli, D., Tritt, T., Annu. Rev. Mater. Sci. 29, 89 (1999).Google Scholar
4. Nolas, G., Kaeser, M., Littleton, R.T. IV and Tritt, T.M., Appl. Phys. Lett. 77/12, 1855 (2000).Google Scholar
5. Uher, C.: Skutterudites, Academic Press ISBN 0-12-7521, 78-x Vol. 69, 139-253(2001).Google Scholar
6. Li, H., Tang, X.F., Zhang, Q.J., Uher, C., Appl. Phys. Lett. 94, 102114 (2009).Google Scholar
7. Zhang, L., Grytsiv, A., Kerber, M., Rogl, P., Bauer, E. and Zehetbauer, M., J. Alloys and Compd., 490, 19–25 (2010).Google Scholar
8. Rogl, G., Grytsiv, A., Bauer, E., Rogl, P. and Zehetbauer, M., Intermetallics 18, 57–60 (2010).Google Scholar
9. Rogl, G., Grytsiv, A., Rogl, P., Bauer, E., Kerber, M.B., Zehetbauer, M. and Puchegger, S., Intermetallics 18, 2435–2444 (2010).Google Scholar
10. Rogl, G., Grytsiv, A., Bauer, E., Rogl, P. and Zehetbauer, M., Intermetallics 19, 546–555 (2010).Google Scholar
11. Zhang, L., Grytsiv, A., Kerber, M., Rogl, P., Bauer, E., Zehetbauer, M. J., Wosik, J. and Nauer, G. E., J. Alloys and Compd. 481, 106–115 (2009).Google Scholar
12. Migliori, A. and Maynard, J.D.,. Rev. of Scient. Instr. 76, 121301 (2005).Google Scholar
13. Zhang, L., Rogl, G., Grytsiv, A., Puchegger, S., Kopensteiner, J., Spieckermann, F., Kabelka, H., Reinecker, M., Rogl, P., Schranz, W., Zehetbauer, M. and Carpenter, M.A., Mat. Science and Eng. B170, 26–31 (2010).Google Scholar
14. Schmidt, R., Case, E., Ni, J., Sakamoto, J., Timm, E., Trejo, R., Lara-Curzio, E., Payzant, E. A., Kirkham, M., and Peascoe-Meisner, R., Presentation MRS Fall Meeting Boston (29.11 – 3.12 2010), not published in print.Google Scholar
15. Puchegger, S., Dose, F., Loidl, D., Kromp, K., Janssen, R., Brandhuber, D., Hüsing, N. and Peterlik, H., J. Europ. Ceram. Soc. 27, Issue 1, 35–39 (2007).Google Scholar
16. Salvador, J.R., Yang, J., Shi, X., Wang, H., Wereszczak, A.A., Kong, H., Uher, C., Phil. Magazine, 89/19 1517-1534.Google Scholar
17. Keppens, V., Sales, B.C., Mandrus, D., Chakoumakos, B.C., Laermans, C., (Mat. Res. Soc. Symp. Proc. 626, 2000) Z13.3.Google Scholar
18. Mandrus, D., Sales, B.C., Keppens, V., Chakoumakos, B.C., Dai, P., Boatner, L.A., Williams, R.K., Thompson, J.R., Darling, T.W., Migliori, A., Maple, M.B., Gajewski, D.A. and Freeman, E.J. (Mat. Res. Soc. Symp. Proc. 478, 1997) p.199–209.Google Scholar
19. Ravi, V., Firdosy, S., Caillat, T., Lerch, B., Calamino, A., Pawlik, R., Nathal, M., Sechrist, A., Buchhalter, J., and Nutt, S., (Space Int. Forum STAIF 2008, edited by El-Genk, M.S.) American Institute of Physics 969 (2008) pp. 656–662.Google Scholar