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Defects in Superconductor thin Films

Published online by Cambridge University Press:  15 February 2011

A. S. Nandedkar
Affiliation:
C A S A, 15 Dartantra Dr., Hopewell Junction, NY 12533, U. S. A.
L. Ganapathi
Affiliation:
Excel Superconductor Inc., 140-29, Keyland Court, Bohemia, NY 11716, U. S. A.
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Abstract

Computer aided simulations were used to investigate various grain boundary configurations in superconducting (YBa2Cu3O7) thin films. Four angles for tilt grain boundaries were simulated (12.45°, 53.5°, 66.4°, and 74.6°). Energies of unrelaxed configurations were calculated.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

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