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Correlations Between Electrical and Material Properties of CVD Diamond

Published online by Cambridge University Press:  21 February 2011

C. White ,
S. Zhao ,
K. K. Gan ,
H. Kagan ,
R. Kass ,
R. Malchow ,
F. Morrow ,
W. Palmer ,
S. Han  and
D. Kania
...Show all authors
C. White
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
S. Zhao
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
K. K. Gan
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
H. Kagan
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
R. Kass
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
R. Malchow*
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
F. Morrow
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
W. Palmer
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
S. Han*
Affiliation:
Laser Division, Lawrence Livermore National Laboratory, Livermore, CA 94550
D. Kania
Affiliation:
Laser Division, Lawrence Livermore National Laboratory, Livermore, CA 94550
L. S. Pan
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
S. Schnetzer
Affiliation:
Department of Physics, Rutgers University, Piscataway, NJ 08854
R. Stone
Affiliation:
Department of Physics, Rutgers University, Piscataway, NJ 08854
R. Teserek
Affiliation:
Department of Physics, Rutgers University, Piscataway, NJ 08854
J. Angus
Affiliation:
Department of Chemical Engineering, CWRU, Cleveland, OH 44106
S. J. Ma
Affiliation:
Department of Chemical Engineering, CWRU, Cleveland, OH 44106
Y. Sugimoto
Affiliation:
KEK National Laboratory, Tsukuba-shi, Ibaraki-ken, Japan 305
*
1 Current address: Colorado State University, Fort Collins, CO 80523
2Current address: Los Alamos National Lab, Los Alamos, NM 87545
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Abstract

The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 339: Symposium D – Diamond, Silicon Carbide and Nitride Wide Bandgap Semiconductors , 1994 , 589
Copyright
Copyright © Materials Research Society 1994

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References

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