Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-17T16:17:09.639Z Has data issue: false hasContentIssue false
  • English
  • Français

Relationship Between Interfacial Strain and the Elastic Response of Multilayer Metal Film

Published online by Cambridge University Press:  22 February 2011

Bruce M. Clemens  and
Gary L. Eesley
Bruce M. Clemens
Affiliation:
Physics Department, General Motors Research Laboratories, Warren, Michigan 48090-9055.
Gary L. Eesley
Affiliation:
Physics Department, General Motors Research Laboratories, Warren, Michigan 48090-9055.
Get access

Abstract

We have used x-ray diffraction and picosecond transient piezoreflectance to investigate the structural and elastic properties of three distinct multilayer systems: Mo/Ni, Pt/Ni and Ti/Ni. We demonstrate that the commonly observed lattice expansion perpendicular to the film plane is not a bulk effect, but is localized at the interface between the contacting metals. Incorporating the measured interfacial expansion into a universal binding relation, we show that the measured elastic softening versus compositional repeat distance can result from the interfacial strain.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 130: Symposium C – Thin Films: Stresses and Mechanical Properties I , 1988 , 307
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Schuller, I. K., IEEE Ultrasonics Symposium 1985, 1093 (1985).Google Scholar
2. Kueny, A., Grimsditch, M., Miyano, K., Banerjee, I., Falco, C. M. and Schuller, I. K., Phys. Rev. Lett. 48(3), 166 (1982).Google Scholar
3. Khan, M. R., Chun, C. S. L., Felcher, G. P., Grimsditch, M., Kueny, A., Falco, C. M., and Schuller, I. K., Phys. Rev. B 27, 7186 (1983).10.1103/PhysRevB.27.7186Google Scholar
4. Danner, R., Huebener, R. P., Chun, C. S. L., Grimsditch, M., and Schuller, I. K., Phys. Rev. B 33(6), 3696 (1986).10.1103/PhysRevB.33.3696Google Scholar
5. Bell, J. A., Bennett, W. R., Zanoni, R., Stegeman, G. I., Falco, C. M., and Nizzoli, F., Phys. Rev. B 35(8), 4127 (1987).10.1103/PhysRevB.35.4127Google Scholar
6. Bisanti, P., Brodsky, M. B., Felcher, G. P., Grimsditch, M., and Sill, L. R., Phys. Rev. B 35(15), 7813 (1987).10.1103/PhysRevB.35.7813Google Scholar
7. Yang, W. M. C., Tsakalakos, T. and Hilliard, J. E., J. of Appl. Phys. 48(3), 876 (1977).10.1063/1.323749Google Scholar
8. Helmersson, U., Todorova, S., Barnett, S. A., and Sundgren, J.-E., J. of Appl. Phys. 62(2), 481 (1987).10.1063/1.339770Google Scholar
9. Wu, T. B., J. of Appl. Phys. 53, 5265 (1982).10.1063/1.331361Google Scholar
10. Cammarata, R. C., Scripta Met. 20, 479 (1986).10.1016/0036-9748(86)90239-5Google Scholar
11. Schuller, I. K. and Rahman, A., Phys. Rev. Lett. 50(18), 1377 (1983).10.1103/PhysRevLett.50.1377Google Scholar
12. Banerjea, A. and Smith, J. R., Phys. Rev. B 35(11), 5413 (1987).10.1103/PhysRevB.35.5413Google Scholar
13. Clemens, B. M. and Eesley, G. L., Phys. Rev. Lett. 61, 2356 (1988).10.1103/PhysRevLett.61.2356Google Scholar
14. Eesley, G. L., Clemens, B. M. and Paddock, C. A., Appl. Phys. Lett. 50(12), 717 (1987).10.1063/1.98077Google Scholar
15. Clemens, B. M. and Gay, J. G., Phys. Rev. B 35, 9337 (1987) Rapid Communication.Google Scholar
16. Schuller, I. K., Phys. Rev. Lett. 44, 1597 (1980).10.1103/PhysRevLett.44.1597Google Scholar
17. Bauer, E. and van der Merwe, Jan. H., Phys. Rev. B 33(6), 3657 (1986).10.1103/PhysRevB.33.3657Google Scholar
18. Van der Merwe, J. H., J. of Appl. Phys. 34, 123 (1962).Google Scholar
19. Rose, J. H., Smith, J. R., and Ferrante, J., Phys. Rev. B 28(4), 1835 (1983).10.1103/PhysRevB.28.1835Google Scholar
20. Vinet, P., Ferrante, J., Rose, J. H. and Smith, J. R., J. of Geophys. Res.. 92, 9319 (1987).10.1029/JB092iB09p09319Google Scholar
21. Rytov, S. M., Soy. Phys. Acc. 2, 68 (1956).Google Scholar
22. If the interface density is different from the average of the two metals, an additional factor of multiplies the right hand side of Eq. 2.Google Scholar
23. Jackson, C.M., Wagner, H. J. and Wasilewski, R. J., 55-Nitinol- The Alloy with a Memory: Physical Metallurgy, Properties and Applications, Volume NASASP5110 (Nat. Aero. and Space Adm., Washington, D. C., 1972).Google Scholar
24. Clemens, B. M., Phys. Rev. B 33(11), 7615 (1986).10.1103/PhysRevB.33.7615Google Scholar