Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-19T22:40:34.740Z Has data issue: false hasContentIssue false

Indium-Copper Multilayer Composite Solder for Fluxless Bonding

Published online by Cambridge University Press:  21 February 2011

Chin C. Lee
Affiliation:
Department of Electrical and Computer Engineering, University of California, Irvine, CA. 92717
Yi-Chia Chen
Affiliation:
Department of Electrical and Computer Engineering, University of California, Irvine, CA. 92717
Get access

Abstract

A 200°C fluxless process is developed to produce In-Cu joints. The fluxless feature is achieved by the prevention of indium oxidation during the solder fabrication and the bonding process. Indium and copper are deposited on an object in high vacuum to inhibit indium oxidation. Copper interacts with indium to form CuIn compound that further protects the inner indium from oxidation. For a specific design, the resulting joints consist of mainly CuIn intermetallic grains surrounded by a small amount of pure indium as revealed by SEM with EDX. Scanning acoustic microscope examination indicates that the joints are nearly void-free. This technology enables versatile control of the alloy composition, thus leading to several remelting temperatures and various physical properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lau, J. H. and Rice, D. W., Solid State Technology, 1985, 91.Google Scholar
2. Hampshire, W. B., “Solders,” in Electronic Materials Handbook. vol. 1. Packaging, (ASM International, Materials Park, OH, 1989), p. 633.Google Scholar
3. Lee, Chin C., wang, Chen Y. and Matijasevic, Goran, IEEE Trans. Components, Hybrids and Manufactureing Tech., 14, 407 (1991).Google Scholar
4. Matijasevic, Goran, Chen, Yi-Chia and Lee, Chin C., International J. Microcircuits and Electronic Packaging, 17, 108 (1994).Google Scholar
5. Tyler, Derek, in Metals Handbook, Vol.8, ed. by Lyman, T., Boyer, H. E. and others, (American Society for Metals, Metals Park, Ohio, 1973), p. 294 Google Scholar
6. Roy, Rita and Sen, S. K., J. Mater. Res. 7 (6), 1377 (1992)Google Scholar
7. Simic, V. and Marinkovic, Z., J. Less-Comm. Metals, 72, 133 (1980)Google Scholar
8. Subramanian, P. R. and Laughlin, D. E., in “Cu-In (Copper-Indium),” Binary Alloy Phase Diagrams, ed. by Massalski, T. B., (ASM International, Metals Park, Ohio, 1990), p. 1424 Google Scholar