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High Resolution Transmission Electron Microscopy of Partial States of Oxygen Order in YBa2Cu3Oz

Published online by Cambridge University Press:  21 February 2011

C. P. Burmester ,
S. Quong ,
L. T. Wille ,
R. Gronsky ,
B. T. Ahn ,
V. Y. Lee ,
R. Beyers ,
T. M. Gür  and
R. A. Huggins
C. P. Burmester
Affiliation:
Department of Materials Science and Mineral Engineering, University of California, and the National Center for Electron Microscopy at Lawrence Berkeley Laboratory, Berkeley, California
S. Quong
Affiliation:
Department of Materials Science and Mineral Engineering, University of California, and the National Center for Electron Microscopy at Lawrence Berkeley Laboratory, Berkeley, California
L. T. Wille
Affiliation:
Department of Physics, Florida Atlantic University, Boca Raton, Florida
R. Gronsky
Affiliation:
Department of Materials Science and Mineral Engineering, University of California, and the National Center for Electron Microscopy at Lawrence Berkeley Laboratory, Berkeley, California
B. T. Ahn
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, California
V. Y. Lee
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, California
R. Beyers
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, California
T. M. Gür
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California
R. A. Huggins
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California
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Abstract

High resolution electron microscopy is used to investigate the effect of electron irradiation induced oxygen loss on the states of partial order in YBa2Cu3Oz. Contrast effects visible in the [001] zone image as a result of the degree of the out-of-plane correlation of these ordered states are investigated. Using statistical simulations to aid in the analysis of the HREM images, an interpretation based on a kinetically limited evolution of the variation of long range [001] ordering is proposed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 183: Symposium E – High Resolution Electron Microscopy of Defects in Materials , 1990 , 369
Copyright
Copyright © Materials Research Society 1990

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References

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