Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-29T08:16:50.781Z Has data issue: false hasContentIssue false

Epitaxial Growth Of Nickel and Cobalt Germanides On Germanium

Published online by Cambridge University Press:  28 February 2011

Y.F. Hsieh
Affiliation:
Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
L.J. Chen
Affiliation:
Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
E.D. Marshall
Affiliation:
Department of Electrical Engineering and Computer Science, University of California, San Diego, La Jolla, CA 92093
S.S. Lau
Affiliation:
Department of Electrical Engineering and Computer Science, University of California, San Diego, La Jolla, CA 92093
Get access

Abstract

Transmission and scanning electron microscopy, Rutherford backscattering-channeling and Read camera glancing angle x-ray diffraction techniques have been applied to study the epitaxial growth of nickel and cobalt germanides on germanium.

NiGe, Co5Ge7 and CoGe2 were found to grow epitaxially on both (001) and (111)Ge. More extensive epitaxy on (111)Ge is correlated with better lattice matches at the germanide/Ge interfaces than those on (001)Ge for these epitaxial germanides.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Tu, K.N. and Mayer, J.W., in Thin Films - Interdiffusion and Reactions, edited by Poate, J.M., Tu, K.N., and Mayer, J.W. (Wiley, New York, 1978), p. 359.Google Scholar
2. Nicolet, M.A. and Lau, S.S., in Materials and Process Characterization, edited by Einspruch, N.G. and Larrabee, G.B. (Academic, New York, 1983), p/ 329.Google Scholar
3. Thanailaikis, A. and Northrop, D.C., Solid State Electron. 16, 1383 (1973).Google Scholar
4. Wittmer, M.W., Nicolet, M.A., and Mayer, J.W., Thin Solid Films 42, 51 (1977).Google Scholar
5. Ottaviani, G., Canali, C., Ferrari, G., Majni, G., Prudenziate, M., and Lau, S. S., Thin Solid Films 47, 187 (1977).Google Scholar
6. Grimaldi, M.G., Wielunski, L., Nicolet, M.A., and Tu, K.N., Thin Solid Films 81, 107 (1981).Google Scholar
7. Le Lay, G., Surf. Sci. 132, 169 (1984).Google Scholar
8. Miller, T., Phys. Rev. 30, 570 (1984).Google Scholar
9. Marshall, E.D., Wu, C.S., Pai, C.S., Scott, D.M., and Lau, S.S., Mater. Res. Soc. Symp. Proc. 47, 161 (1985).Google Scholar
10. del Giudice, M., Butera, R.A., Joyce, J.J., Buckman, M.W., and Weaver, J.H., Mater. Res. Soc. Symp. Proc. 54, 91 (1986).Google Scholar
11. Chen, L.J., Cheng, H.C., and Lin, W.T., Mater. Res. Soc. Symp. Proc. 54, 245 (1986).Google Scholar
12. Tung, R.T., Phys. Rev. Lett. 52, 461 (1984).Google Scholar
13. Zur, A., McGill, T.C., and Nicolet, M.A., J. Appl. Phys. 57, 600 (1985).Google Scholar
14. Hsieh, Y.F., Chen, L.J., Marshall, E.D., and Lau, S.S., unpublished work.Google Scholar