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Dynamic TEM Observation on Oxide Glass Materials

Published online by Cambridge University Press:  21 February 2011

Sumio Iijima
Sumio Iijima*
Affiliation:
NEC Corporation, Fundamental Research Laboratories, 34, Miyukigaoka, Tsukuba 305, Japan
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Abstract

Intensity fluctuation in high resolution electron microscope (HREM) images of amorphous Tl-Ba-Ca-Cu-O oxide films is observed. The fluctuation with a frequency of few tens of Hertz and an amplitude of about 0.3nm, occurs under an intense electron beam irradiation. It is shown experimentally that atom migration in the films is responsible for the fluctuations. The result is also supported by computer image simulations on a model structure for amorphous film.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 183: Symposium E – High Resolution Electron Microscopy of Defects in Materials , 1990 , 349
Copyright
Copyright © Materials Research Society 1990

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