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Characterization of Conductive Anodic Filament (Caf) by X-Ray Microtomography and by Serial Sectioning

Published online by Cambridge University Press:  15 February 2011

S. R. Stock ,
L. L. Dollar ,
G. B. Freeman ,
W. J. Ready ,
L. J. Turbini ,
J. C. Elliott ,
P. Anderson  and
G. R. Davis
S. R. Stock
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
L. L. Dollar
Affiliation:
presently with Lockheed Aeronautical Systems, Marietta, GA
G. B. Freeman
Affiliation:
Electrical, Optical and Materials Lab., Georgia Inst. of Technology, Atlanta, GA
W. J. Ready
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
L. J. Turbini
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
J. C. Elliott
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
P. Anderson
Affiliation:
Dept. of Child Dental Health, London Hospital Medical College, London, UK
G. R. Davis
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
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Abstract

X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CAFs) had grown, Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 323: Symposium J – Electronic Packaging Materials Science VII , 1993 , 65
Copyright
Copyright © Materials Research Society 1994

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