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AFM Induced Local Oxidation of HOPG

Published online by Cambridge University Press:  14 March 2014

Kenichi Uki
Affiliation:
Advanced Device Laboratories and Department of Physics, Tokyo University of Science. Shinjuku, Tokyo 162-8601, Japan, Phone: +81-3-3260-4272
Mikihiro Kato
Affiliation:
Advanced Device Laboratories and Department of Physics, Tokyo University of Science. Shinjuku, Tokyo 162-8601, Japan, Phone: +81-3-3260-4272
Susumu Harako
Affiliation:
Advanced Device Laboratories and Department of Physics, Tokyo University of Science. Shinjuku, Tokyo 162-8601, Japan, Phone: +81-3-3260-4272
Xinwei Zhao*
Affiliation:
Advanced Device Laboratories and Department of Physics, Tokyo University of Science. Shinjuku, Tokyo 162-8601, Japan, Phone: +81-3-3260-4272
*
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Abstract

AFM induced local anodic oxidation of HOPG was carried out in various conditions such as humidity, applied voltage and scan speed. A clear evidence of different oxidation features between HOPG and graphene has been confirmed and discussed.

These results should contribute to the progress of the micro/nano fabrication of graphene by the local anodic oxidation.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

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