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Effect of the ligand in the crystal structure of zinc oxide: an x-ray powder diffraction, x-ray absorption near-edge structure, and an extended x-ray absorption fine structure study

Published online by Cambridge University Press:  20 April 2016

María de los A. Cepeda-Pérez ,
Cristina M. Reyes-Marte ,
Valerie Ann Carrasquillo ,
William A. Muñiz ,
Edgar J. Trujillo ,
Rahul Singhal ,
Harry Rivera  and
Mitk'El B. Santiago-Berríos
María de los A. Cepeda-Pérez
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Cristina M. Reyes-Marte
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Valerie Ann Carrasquillo
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
William A. Muñiz
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Edgar J. Trujillo
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Rahul Singhal
Affiliation:
Department of Physics and Engineering Physics, Central Connecticut State University, New Britain, CT-06050
Harry Rivera
Affiliation:
Inter American University of Puerto Rico, Bayamón Campus, Carr 500 Dr John W. Harris, Bayamón 00957, Puerto Rico
Mitk'El B. Santiago-Berríos*
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
*
Address all correspondence to Mitk'El B. Santiago-Berríos at [email protected]
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Abstract

We analyze the effect of functionalization in the surface of zinc oxide crystal structure by 3-mercaptopropionic acid. X-ray powder diffraction data and extended x-ray absorption fine structure studies confirms a wurtzite structure. However, the morphology of the surface seems to be reduced and shows a film-like surface as demonstrated by x-ray absorption near edge structure and scanning electron microscopy. As a result of surface functionalization, the energy levels of the semiconductor were shifted toward reductive potentials (by 50 mV) as determined by diffuse reflectance and cyclic voltammetry.

Type
Research Letters
Information
MRS Communications , Volume 6 , Issue 2 , June 2016 , pp. 93 - 97
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Copyright
Copyright © Materials Research Society 2016 

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