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On the bending strength of single-crystal silicon theta-like specimens
Published online by Cambridge University Press: 30 May 2013
Abstract
A new theta geometry was developed for microscale bending strength measurements. This new “gap” theta specimen was a modification of the arch theta specimen that enabled microscale tensile testing. The gap theta specimen was demonstrated here on single-crystal silicon, microfabricated using two different etch processes. The resulting sample strengths were described by three-parameter Weibull distributions derived from parameters determined using established arch theta strengths, assuming a specimen-geometry and -size invariant flaw distribution and an approximate loading configuration.
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- Research Letters
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- Copyright © Materials Research Society 2013
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