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MEMS-based dual temperature control measurement method for thermoelectric properties of individual nanowires

Published online by Cambridge University Press:  03 September 2020

Yan Cui ,
Yang Yang ,
Shuai Liu ,
Sheng Dai Open the ORCID record for Sheng Dai [Opens in a new window] ,
Tie Li  and
Yuelin Wang
Yan Cui*
Affiliation:
Key Laboratory for Advanced Materials and Feringa Nobel Prize Scientist Joint Research Center, Institute of Fine Chemicals, School of Chemistry and Molecular Engineering, East China University of Science and Technology, Shanghai200237, China
Yang Yang
Affiliation:
Science and Technology on Micro-system Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai200050, China
Shuai Liu
Affiliation:
College of Science, Xi'an Shiyou University, Xi'an, Shaanxi710065, China
Sheng Dai
Affiliation:
Key Laboratory for Advanced Materials and Feringa Nobel Prize Scientist Joint Research Center, Institute of Fine Chemicals, School of Chemistry and Molecular Engineering, East China University of Science and Technology, Shanghai200237, China
Tie Li
Affiliation:
Science and Technology on Micro-system Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai200050, China
Yuelin Wang*
Affiliation:
Science and Technology on Micro-system Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai200050, China
*
Address all correspondence to Yan Cui at [email protected]; Yuelin Wang at [email protected]
Address all correspondence to Yan Cui at [email protected]; Yuelin Wang at [email protected]
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Abstract

The development of thermoelectric measurement technology at nanoscale is a challenging task. Here, a novel MEMS-based dual temperature control (DTC) measurement method for thermoelectric properties of individual nanowires was proposed. Different from conventional thermal bridge testing devices, this DTC thermoelectric testing device can obtain the thermoelectric properties by independently control ambient temperature and temperature difference between two ends of the nanowires through two separate resistance thermometers without auxiliary heating devices. The reliability of the model and the testing accuracy were verified by accurately measuring the thermal conductivity, electrical conductivity, and the absolute value of the Seebeck coefficient of VO2 nanowires.

Type
Research Letters
Information
MRS Communications , Volume 10 , Issue 4 , December 2020 , pp. 620 - 627
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Copyright
Copyright © The Author(s), 2020, published on behalf of Materials Research Society by Cambridge University Press

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