Focused ion beam technology and applications. Focused ion beam (FIB) microscopes coupled with a scanning electron microscope (SEM) offer the opportunity for novel sample imaging, sectioning, specimen preparation, three-dimensional nano- to macroscale tomography, and high resolution rapid prototyping. The articles in this issue of MRS Bulletin feature the state of the art in FIB technology and its applications in materials research, providing insights into future potential for materials characterization and processing using FIBs. The cover image shows a three-dimensional view of FIB-patterned silicon milled for a microfl uidic serpentine mixer application. Image courtesy of the American Vacuum Society. See the technical theme that begins on page 317.
Society News
News
Albert Polman to receive MRS Innovation in Materials Characterization Award
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- 09 April 2014, p. 374
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Lei Jiang to receive Mid-Career Researcher Award for bioinspired materials
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- 09 April 2014, p. 374
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Henry J. Snaith named 2014 MRS Outstanding Young Investigator for perovskite hybrid solar cells
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- 09 April 2014, p. 375
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Yury Gogotsi to present Kavli Lecture on nanoscience at 2014 MRS Spring Meeting
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- 09 April 2014, p. 375
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Big Data sessions bring variety of opinions
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- 09 April 2014, p. 376
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MRS and E-MRS organize summer school on materials for renewable energy: www.erice-energy-materials.ct.infn.it
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- 09 April 2014, p. 377
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Career Central
Other
CAREER CENTRAL
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- Published online by Cambridge University Press:
- 09 April 2014, pp. 380-383
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Front Cover (OFC, IFC) and matter
MRS volume 39 issue 4 Cover and Front matter
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- 09 April 2014, pp. f1-f6
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Back Cover (OBC, IBC) and matter
MRS volume 39 issue 4 Cover and Back matter
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- 09 April 2014, pp. b1-b2
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