No CrossRef data available.
Article contents
Nanoparticle Localization Using Gabor Filters
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS143192762201162X/resource/name/firstPage-S143192762201162Xa.jpg)
- Type
- Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Gabor, D, Journal of the Institution of Electrical Engineers 93 (1946), p. 429-441. doi:10.1049/ji-3-2.1946.0074Google Scholar
Daugman, J, Journal of the Optical society of America 2 (7) (1985), p. 1160-1169. doi:10.1364/JOSAA.2.001160CrossRefGoogle Scholar
Manjunath, B, IEEE Transactions on Pattern Analysis and Machine Intelligence 18 (8) (1996), p.837-842. doi: 10.1109/34.531803CrossRefGoogle Scholar
Jones, L and Nellist, PD, Microscopy and Microanalysis 19 (4) (2013), p. 1050-1060. doi: 10.1017/S1431927613001402CrossRefGoogle Scholar
AHR thanks to ConTex Doctoral Fellowship program #2019-000027-01EXTF-00125. AM acknowledges the Spanish Ministry of Science through the Ramon y Cajal program (RYC2018-024561-I), to the regional government of Aragon (DGA E13_20R), to the European Union's Horizon 2020 research and innovation program under grant agreement No 823717 – ESTEEM3 and to the National Natural Science Foundation of China (NSFC- 21835002) for funding.Google Scholar