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Application of Deep Unsupervised Convolutional Neural Networks to Denoise Large Temporally Resolved In Situ TEM Datasets
Published online by Cambridge University Press: 22 July 2022
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- Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
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- Copyright
- Copyright © Microscopy Society of America 2022
References
Vincent, JL et al. , Microscopy and Microanalysis, (27)6, p. 1431.10.1017/S1431927621012678CrossRefGoogle Scholar
We gratefully acknowledge the support of the following NSF grants (OAC 1940263, OAC 1940097, CBET 1604971 and DMR 184084). We also acknowledge the support from DOE grant BES DE-SC0004954. The authors acknowledge HPC resources available through ASU, and NYU as well as the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State.Google Scholar
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