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Advanced In Situ TEM Nanomechanical Testing Options with the PI-95

Published online by Cambridge University Press:  22 July 2022

Sanjit Bhowmick ,
Eric Hintsala  and
Douglas Stauffer
Sanjit Bhowmick*
Affiliation:
Bruker Nano, Minneapolis, MN, USA
Eric Hintsala
Affiliation:
Bruker Nano, Minneapolis, MN, USA
Douglas Stauffer
Affiliation:
Bruker Nano, Minneapolis, MN, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3174 - 3175
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Copyright
Copyright © Microscopy Society of America 2022

References

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