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NanoMi: An Open Source Electron Microscope Component Integration

Published online by Cambridge University Press:  22 July 2022

M. Malac ,
D. Homeniuk ,
M. Kamal ,
J. Kim ,
M. Salomons ,
M. Hayashida ,
J. A. Marin-Calzada ,
D. Vick ,
D. Price  and
R.F. Egerton
M. Malac
Affiliation:
NRC-NANO, Edmonton, Canada Department of Physics, University of Alberta, Edmonton, Canada
D. Homeniuk
Affiliation:
NRC-NANO, Edmonton, Canada
M. Kamal
Affiliation:
Electrical Engineering, University of Alberta, Edmonton, Canada
J. Kim
Affiliation:
Electrical and Comp. Eng., University of British Columbia, Vancouver, Canada
M. Salomons
Affiliation:
NRC-NANO, Edmonton, Canada
M. Hayashida
Affiliation:
NRC-NANO, Edmonton, Canada
J. A. Marin-Calzada
Affiliation:
Department of Physics, University of Alberta, Edmonton, Canada
D. Vick
Affiliation:
NRC-NANO, Edmonton, Canada
D. Price
Affiliation:
NRC-NANO, Edmonton, Canada
R.F. Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton, Canada

Abstract

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Type
On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3164 - 3165
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Copyright
Copyright © Microscopy Society of America 2022

References

Malac, M. et al. , Micr. and Microanal. 26 (S2) (2020), p. 1810-1811.10.1017/S1431927620019431CrossRefGoogle Scholar
Malac, M. et al. , Micr. and Microanal. 27 (S1), 1062-1063.10.1017/S1431927621004001CrossRefGoogle Scholar
nanomi.org and https://osf.io/bpj73, DOI: 10.17605/OSF.IO/BPJ7310.17605/OSF.IO/BPJ73CrossRefGoogle Scholar
https://www.gnu.org/licenses/gpl-3.0.en.html and https://opensource.org/CERN-OHL-WGoogle Scholar
Rempfer, G., J. Appl. Phys. 57 (1985), p. 2385.10.1063/1.334347CrossRefGoogle Scholar